Aletheia Imaging Solutions Ltd

Aletheia Imaging Solutions Ltd （AIS）是一家从曼彻斯特大学分离出来的工业计量公司。AIS业务计划的核心是一项正在申请专利的创新技术，即能够计算x射线计算机断层扫描（XCT）空间分辨率和测量置信度的3D校准目标。AIS 3D校准目标使用户能够利用XCT的巨大功能进行无损检测（NDT）。通过与工业合作伙伴合作进行的详细案例研究，AIS方法用于XCT计量已被证明是校准XCT设备的可靠方法。AIS方法旨在允许XCT用户检查增材制造（AM）组件的缺陷，以便将其部署在关键任务应用程序中。如果用于执行检查的XCT仪器经过校准，并且知道相应的空间分辨率和测量置信度，则XCT只能作为关键任务部件的无损检测方法。AIS三维标定目标提供了这些参数。增材制造比其他制造方法更快、更经济，因此客户可以通过使用AIS方法来实现大量的成本节约，使增材制造成为他们选择的制造技术。虽然已经证明AIS三维校准目标是有效的，并且是XCT计量的高效工具，但目前还没有办法对三维校准目标本身进行校准。不可避免的是，用于生产AIS设备的制造过程中的错误将导致假设相同的设备之间的小几何变化。在该项目中，AIS将与国家物理实验室（NPL）合作开发一种表征程序，使用扫描电子显微镜等成像技术来描绘3D校准目标上的特征尺寸。该例程旨在输出表征设备的“指纹”，详细说明正在调查的实际设备与理想设计之间的任何差异。该项目将寻求确定进行表征的最佳成像技术，并参与数字解决方案的开发，以使结果能够用于使用AIS设备的后续计算。该项目的成功完成将提高AIS 3D校准目标的实用性，并确保AIS保持其在XCT计量市场的世界领先地位。

Aletheia Imaging Solutions Ltd (AIS) is an industrial metrology spin out from The University of Manchester. At the heart of the AIS business plan is an innovative, patent pending, piece of technology, a 3D calibration target capable of permitting the calculation of spatial resolution and measurement confidence in X-ray Computed Tomography (XCT). The AIS 3D calibration target enables users to exploit the vast capabilities of XCT for non-destructive testing (NDT) purposes. Through detailed case studies performed in collaboration with industrial partners, the AIS approach to XCT metrology has been proven to be a reliable means for calibrating XCT equipment. The AIS approach is intended to allow XCT users to inspect additively manufactured (AM) components for defects in order to allow them to be deployed in mission critical applications. XCT can only be relied upon as an NDT method for mission critical components if the XCT instruments employed to carry out the inspections are calibrated and the corresponding spatial resolution and measurement confidence values are known. The AIS 3D calibration target provides these parameters. AM is much faster and more economical than alternative fabrication methods, so customers stand to achieve vast cost savings by using the AIS approach to enable AM to be employed as their chosen manufacturing technique. Although it is proven that the AIS 3D calibration target works and is a highly effective tool for XCT metrology, there is currently no way of calibrating the 3D calibration targets themselves. It is inevitable that errors in the manufacturing processes used to produce the AIS devices will result in small geometric variations between supposedly identical devices. In this project, AIS will work with the National Physical Laboratory (NPL) to develop a characterisation routine to use imaging techniques such as scanning electron microscopy to profile the dimensions of the features on the 3D calibration targets. It is intended that this routine will output a "fingerprint" of the characterised device, detailing any variations between the actual device under investigation and the idealised design. The project will seek to determine the optimal imaging technique for carrying out the characterisation and engage in the development of a digital solution to enable the results to be used in subsequent calculations using the AIS devices. Successful completion of the project will enhance the utility of the AIS 3D calibration targets and ensure AIS maintains its position as a world leader in the XCT metrology market.