Cutting-edge electron backscatter diffraction for materials analysis

该项目旨在为快速、定量的微观结构分析提供一个创新平台，以加强中长期的基础和应用材料和矿物研究。配备下一代探测器的新型扫描电子显微镜将取代老化的系统，并使数据采集和处理速度提高几个数量级。该项目将利用新兴技术来提高我们快速表征天然和人造晶体材料的能力，并推动包括地球科学、行星科学和机械工程在内的广泛学科的创新研究。数量级更快的数据采集速度将支持增加的用户群，并减少仪器访问的等待时间。在这个项目中取得的技术发展将有利于学术研究界，也将转移到广泛的工业最终用户。

This project aims to provide an innovative platform for rapid, quantitative microstructural analysis that will strengthen medium to long-term fundamental and applied materials and minerals research. A new scanning electron microscope, with next-generation detectors, will replace aging systems and enable improved, and orders-of-magnitude faster, data acquisition and processing. The project will utilise emerging technologies to advance our ability to rapidly characterise natural and man-made crystalline materials and drive innovative research across a broad range of disciplines including geoscience, planetary science and mechanical engineering. The orders-of-magnitude faster data acquisition speeds will support an increased user-base and reduce waiting times for instrument access. The technological developments made in this project will benefit the academic research community and will also be transferable to a broad range of industrial end-users.