Development of advanced non-invasive instrumentation using Cherenkov diffraction radiation

切伦科夫衍射辐射出现当一个快带电粒子移动附近和平行于介电界面。在这种情况下，从界面产生的切伦科夫辐射在介质内部传播，并从输出介质表面折射。辐射的特性取决于带电粒子的位置、方向和横向尺寸，这为开发新的带电粒子束诊断仪器提供了机会。

Cherenkov diffraction radiation appears when a fast charged particle moves in the vicinity and parallel to a dielectric interface. In this case Cherenkov radiation generated from the interface propagates inside the dielectric and refracted from an out put dielectric surface. The properties of the radiation depend on position, direction and transverse dimensions of the charged particle, giving an opportunity to develop novel instruments for charged particle beam diagnostics.