Development of a Modular Reference Artifact to Characterise XCT Systems Performance and Facilitate the Adoption of Additive Manufacturing Technologies

x射线计算机断层扫描（XCT）是一种成熟的三维成像技术，广泛应用于医学成像和材料表征。作为一种能够促进增材制造（AM）在关键工业领域应用的检测工具，XCT可以测量传统触觉和光学方法无法实现的复杂增材制造结构和内部几何形状。然而，与传统的计量方法相比，XCT在尺寸计量方面还不成熟。该项目旨在开发一种模块化的参考人工制品，以同时表征多种XCT性能。该人工制品还将有助于测量典型的AM性能特征。

X-ray Computed Tomography (XCT) is an established 3D imaging technology employed extensively for medical imaging and materials characterisation. Identified as a capable inspection tool to facilitate the adoption of additive manufacturing (AM) in critical industry sectors, XCT can measure complex AM structures and internal geometries unachievable using traditional tactile and optical methods. However, XCT is not considered as mature for dimensional metrology as compared to conventional metrology counterparts. This project aims to develop a modular reference artefact to characterise multiple XCT performances simultaneously. The artefact will also facilitate the measurement of typical AM performance characteristics.