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In-Situ Nanoindentation Tester

In-Situ Nanoindentation Tester
原位纳米压痕仪
批准号:
439647-2013
负责人:
Deng, Chuang
金额:
$9.83万
依托单位:
依托单位国家:
加拿大
项目类别:
Research Tools and Instruments - Category 1 (<$150,000)
财政年份:
2012
资助国家:
加拿大
项目状态:
已结题
起止时间:
2012-01-01 至 2013-12-31

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中文摘要
翻译
在这项提案中,需要一台原位纳米压痕测试仪来支持申请者正在进行的和未来的研究计划,这些计划主要涉及各种纳米材料的合成和测试,包括薄膜、纳米晶涂层和块体纳米晶金属合金。特别是,本提案所要求的设备将主要用于纳米材料的原位纳米压痕和纳米划痕测试,以进行纳米材料的力学表征。为此,该仪器将包括一个原位扫描探针显微镜(SPM,用于表面形貌检查)和一个具有硬尖的纳米压痕系统,该系统可以分别在垂直和横向力模式下运行,用于纳米压痕和纳米划痕测试。
英文摘要
An in-situ nanoindentation tester is requested in this proposal to support on-going and future research programs of the applicants, which are heavily involved in synthesizing and testing of various nano-materials, including thin films, nanocrystalline coatings, and bulk nanocrystalline metal alloys. In particular, the equipment requested in this proposal will be mainly used for in-situ nano-indentation and nano-scratch test for mechanical characterization of nano-materials. For this purpose, the instrument will consist of an in-situ Scanning Probe Microscope (SPM, for surface topography examination) and a nanoindentation system with a hard tip that can operate in both vertical and lateral force modes for nanoindentation and nano-scratch tests, respectively.
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