Probing intermolecular interactions and mapping topographic, nanomechanical, nanoelectrical properties of various materials and engineering systems by AFM

所提出的原子力显微镜（AFM）系统是最新型号，也是世界上性能最高的系统之一，旨在提供卓越的灵敏度，能够同时绘制各种材料的形貌、纳米机械、纳米电、磁和其他物理特性以及界面化学反应过程（例如，聚合物、生物聚合物、蛋白质、纳米颗粒、表面活性剂）、工程和生物系统（例如纳米电子、油砂工程、矿物加工、洁净煤加工），以及蒸汽和复杂流体中的纳米级甚至原子级分辨率。AFM系统有一个集成的环境室，提供了一个容易接近的密封样品室，与系统的其余部分完全隔离，具有精确控制的湿度，温度和反应气体环境，以满足任何实验要求。 它特别适用于表征软质和硬质材料、纳米颗粒和纳米电子器件的分子间力和表面特性，其中需要对表面特性（例如粗糙度、结构、弹性、导电性和化学反应性）的测量具有最高灵敏度。

The proposed atomic force microscope (AFM) system is the latest model and one of the world's highest performance system designed to provide exceptional sensitivity that enables simultaneous mapping of topography, nanomechanical, nanoelectrical, magnetic and other physical properties as well as interfacial chemical reaction processes for a broad range of materials (e.g., polymers, biopolymers, proteins, nanoparticles, surfactants), engineering and biological systems (e.g. nanoelectronics, oil sands engineering, mineral processing, clean coal processing) in vapors and complex fluids with nanoscale or even atomic resolution. The AFM system has an integrated environmental chamber that provides an easily accessible, sealed sample compartment totally isolated from the rest of the system with precisely controlled humidity, temperature and reactive gas environment to match any experimental requirements. It is particularly suitable for the characterization of intermolecular forces and surface properties of both soft and hard materials, nanoparticles and nanoelectronic devices where the highest sensitivity for measurements of surface properties (e.g. roughness, structure, elasticity, conductivity and chemical reactivity) is required.