An Automated Testing Framework for Verification of Measurements in Embedded Systems

嵌入式系统的开发、验证和确认存在设计挑战。我们的研究通过开发工具，技术和架构来帮助开发人员构建高置信度的嵌入式系统来解决这一挑战。Measurements International（MI）开发了用于性能分析的系统，这些系统对不同度量标准（如电压、温度和电阻）的测量精度非常敏感。嵌入式实时系统通常由较小的模块组成，这些模块之间相互作用。装配单元必须使所有模块精确正确地工作。在这个项目中，MI和研究小组将研究测试方法，并开发一个新的自动化测试框架，用于验证嵌入式系统中用于测量的设备。为了开发一个自动化测试框架，我们将识别用于测量的设备的环境和要求，描述缺陷，并分析最先进的测试方法。使用自动化测试框架，MI将能够确保嵌入式系统的测量准确性，预计精度更高。

Design challenges exist for development, verification and validation of embedded systems. Our researchaddresses this challenge by developing tools, techniques and architectures that assist developers in buildinghigh-confidence embedded systems. Measurements International (MI) develops systems that are used forperformance analysis, and these systems are very sensitive to accuracy of measurements of different metricssuch as voltage, temperature, and resistance.Embedded real-time systems often consist of smaller modules, which interact with each other. The assembledunit must have all the modules working precisely and correctly. In this project, MI and the research team willinvestigate testing approaches and develop a new automated testing framework for verification of devices usedfor measurements in embedded systems. To develop an automated testing framework, we will identify theenvironment and requirements of devices used for measurements, characterize defects, and analyzestate-of-the-art testing approaches. Using the automated testing framework, MI will be able to ensurecorrectness of measurements for embedded systems where higher accuracy is anticipated.