Extreme anti-reflection enhanced magneto-optic Kerr effect microscopy.

Extreme anti-reflection enhanced magneto-optic Kerr effect microscopy.
复制标题

DOI:
10.1038/s41467-020-19724-7
复制
发表时间:
2020-11-23
影响因子:
16.6
通讯作者:
Seo MK
Seo MK
中科院分区:
综合性期刊1区
文献类型:
--
作者:
Kim D;Oh YW;Kim JU;Lee S;Baucour A;Shin J;Kim KJ;Park BG;Seo MK

文献摘要

参考文献

被引文献

相似文献

磁性和自旋电子介质提供了基础的科学研究和技术应用。磁光克尔效应(MOKE)显微镜为研究自旋、磁性准粒子和畴壁的动力学提供了最方便的平台。然而,在纳米级自旋织构和最先进的自旋电子器件的研究中,光学技术通常受到极弱的磁光活度和衍射极限的限制。因此,高度精密、昂贵的电子显微镜和扫描探针方法走到了前沿。在这里,我们发现极端抗反射(EAR)显著提高了MOKE显微镜的性能和功能。对于1纳米薄的Co薄膜,我们证明了克尔振幅高达20°,磁畴成像可见度为0.47。特别是,ear增强的MOKE显微镜能够实时检测和统计分析亚波长磁畴反转。此外,我们利用增强磁光双折射和演示无分析仪MOKE显微镜。EAR技术在纳米磁系统的光学研究和应用中具有广阔的前景。磁光克尔效应显微镜用于动态磁研究,但受弱磁光活性的限制。在这里,作者表明,极端的抗反射导致克尔振幅高达20°,并能够实时检测亚波长磁畴反转。
Magnetic and spintronic media have offered fundamental scientific subjects and technological applications. Magneto-optic Kerr effect (MOKE) microscopy provides the most accessible platform to study the dynamics of spins, magnetic quasi-particles, and domain walls. However, in the research of nanoscale spin textures and state-of-the-art spintronic devices, optical techniques are generally restricted by the extremely weak magneto-optical activity and diffraction limit. Highly sophisticated, expensive electron microscopy and scanning probe methods thus have come to the forefront. Here, we show that extreme anti-reflection (EAR) dramatically improves the performance and functionality of MOKE microscopy. For 1-nm-thin Co film, we demonstrate a Kerr amplitude as large as 20° and magnetic domain imaging visibility of 0.47. Especially, EAR-enhanced MOKE microscopy enables real-time detection and statistical analysis of sub-wavelength magnetic domain reversals. Furthermore, we exploit enhanced magneto-optic birefringence and demonstrate analyser-free MOKE microscopy. The EAR technique is promising for optical investigations and applications of nanomagnetic systems. Magneto-optic Kerr effect microscopy is useful for dynamic magnetic studies, but is limited by the weak magneto-optical activity. Here, the authors show that extreme anti-reflection result in a Kerr amplitude as large as 20° and enables real-time detection of sub-wavelength magnetic domain reversals.
DOI: 10.1038/ncomms9889
发表时间: 2015-11-16
影响因子: 16.6
作者:
Bonetti S;Kukreja R;Chen Z;Macià F;Hernàndez JM;Eklund A;Backes D;Frisch J;Katine J;Malm G;Urazhdin S;Kent AD;Stöhr J;Ohldag H;Dürr HA
通讯作者: Dürr HA
DOI: 10.1038/s41566-017-0086-z
发表时间: 2018-03
期刊: Nature photonics
影响因子: 35
作者:
Higo T;Man H;Gopman DB;Wu L;Koretsune T;van 't Erve OMJ;Kabanov YP;Rees D;Li Y;Suzuki MT;Patankar S;Ikhlas M;Chien CL;Arita R;Shull RD;Orenstein J;Nakatsuji S
通讯作者: Nakatsuji S
DOI: 10.1038/nnano.2013.43
发表时间: 2013-04-01
影响因子: 38.3
作者:
Kampfrath, T.;Battiato, M.;Muenzenberg, M.
通讯作者: Muenzenberg, M.
DOI: 10.1063/1.5048972
发表时间: 2018-12-28
影响因子: 3.2
作者:
Everschor-Sitte, K.;Masell, J.;Klaeui, M.
通讯作者: Klaeui, M.
DOI: 10.1109/tmag.1966.1065997
发表时间: 1966-01-01
影响因子: 2.1
作者:
AHN, KY;FAN, GJ
通讯作者: FAN, GJ