Zernike phase contrast in scanning microscopy with X-rays.
Zernike phase contrast in scanning microscopy with X-rays.
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DOI：
10.1038/nphys1765
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发表时间：
2010-11-01
期刊：
影响因子：
19.6
通讯作者：
中科院分区：
文献类型：
--
作者：
扫描 X 射线显微镜将辐射聚焦到一个小点，并通过光栅扫描探测样品。它允许从 X 射线荧光等二次信号中获取信息，从而生成全视野成像中无法获得的样品元素图。如果这些数据与来自透射成像的结构信息相结合，则可以大大增强对这些次级信号的分析和解释。然而，吸收通常可以忽略不计，并且相差不容易获得。 Zernike 相衬最初是在可见光中引入的，是全视场 X 射线显微镜中一项成熟的技术，用于弱吸收样品的可视化。在互易性的基础上，我们演示了泽尼克相衬在扫描 X 射线显微镜中的实现，在硬 X 射线微量元素测量的同时揭示了结构细节。该方法实施简单，不会对荧光图像的分辨率产生重大影响，并提供补充信息。我们展示了生物样本的图像，清楚地证明了将形态与元素信息相关联的优势。
Scanning X-ray microscopy focuses radiation to a small spot and probes the sample by raster scanning. It allows information to be obtained from secondary signals such as X-ray fluorescence, which yields an elemental mapping of the sample not available in full-field imaging. The analysis and interpretation from these secondary signals can be considerably enhanced if these data are coupled with structural information from transmission imaging. However, absorption often is negligible and phase contrast has not been easily available. Originally introduced with visible light, Zernike phase contrast is a well-established technique in full-field X-ray microscopes for visualization of weakly absorbing samples. On the basis of reciprocity, we demonstrate the implementation of Zernike phase contrast in scanning X-ray microscopy, revealing structural detail simultaneously with hard-X-ray trace-element measurements. The method is straightforward to implement without significant influence on the resolution of the fluorescence images and delivers complementary information. We show images of biological specimens that clearly demonstrate the advantage of correlating morphology with elemental information.
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