Limiting factors in atomic resolution cryo electron microscopy: no simple tricks.

Limiting factors in atomic resolution cryo electron microscopy: no simple tricks.
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DOI:
10.1016/j.jsb.2011.05.004
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发表时间:
2011-09
影响因子:
3
通讯作者:
Zhou, Z. Hong
Zhou, Z. Hong
中科院分区:
生物学3区
文献类型:
--
作者:
Zhang, Xing;Zhou, Z. Hong

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为了使大型生物复合体的冷冻电子显微镜(cryoEM)达到原子分辨率,在冷冻电子显微镜图像采集和3D重建中,在低分辨率下可能被忽略的几个因素变得显著限制。在这里,我们提出了彻底的分析四个限制因素:(a)电子束倾斜,(B)不准确的散焦值的测定,(c)通过颗粒的焦点梯度,和(d)特别是对于大颗粒,动态(多)散射的电子。我们还提出了应对这些因素的策略:(a)通过保持平行照明和使用无彗差对准过程,分别可以减少电子束倾斜的发散和方向倾斜分量。此外,通过使用球面像差校正器,可以消除包括螺旋倾斜在内的所有光束倾斜分量的影响。(b)通过对靶区附近的高剂量电子束进行成像,并测量倾斜电子束引起的像移,可以获得离焦值的更精确测量。(c)cryoEM图像的傅立叶变换中的每个已知傅立叶系数是3D结构的两个傅立叶系数的总和,3D傅立叶空间中的两个弯曲的“特征表面”中的每一个上有一个。我们描述了一个简单的基于模型的迭代方法,可以恢复这两个特征表面上的傅立叶系数。(d)动态散射的影响可以通过传递函数的反卷积来校正。这些分析和我们提出的策略提供了有用的指导,为未来的实验设计,以原子分辨率cryoEM重建。
To bring cryo electron microscopy (cryoEM) of large biological complexes to atomic resolution, several factors – in both cryoEM image acquisition and 3D reconstruction – that may be neglected at low resolution become significantly limiting. Here we present thorough analyses of four limiting factors: (a) electron-beam tilt, (b) inaccurate determination of defocus values, (c) focus gradient through particles, and (d) particularly for large particles, dynamic (multiple) scattering of electrons. We also propose strategies to cope with these factors: (a) the divergence and direction tilt components of electron-beam tilt could be reduced by maintaining parallel illumination and by using a coma-free alignment procedure, respectively. Moreover, the effect of all beam tilt components, including spiral tilt, could be eliminated by use of a spherical aberration corrector. (b) More accurate measurement of defocus value could be obtained by imaging areas adjacent to the target area at high electron dose and by measuring the image shift induced by tilting the electron beam. (c) Each known Fourier coefficient in the Fourier transform of a cryoEM image is the sum of two Fourier coefficients of the 3D structure, one on each of two curved ‘characteristic surfaces’ in 3D Fourier space. We describe a simple model-based iterative method that could recover these two Fourier coefficients on the two characteristic surfaces. (d) The effect of dynamic scattering could be corrected by deconvolution of a transfer function. These analyses and our proposed strategies offer useful guidance for future experimental designs targeting atomic resolution cryoEM reconstruction.
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