Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers.
Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers.
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DOI：
10.1038/s41598-023-35526-5
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发表时间：
2023-10-16
影响因子：
4.6
通讯作者：
Eggert, Jon H.
中科院分区：
文献类型：
--
作者：
Dresselhaus-Marais, Leora E.;Kozioziemski, Bernard;Holstad, Theodor S.;Raeder, Trygve Magnus;Seaberg, Matthew;Nam, Daewoong;Kim, Sangsoo;Breckling, Sean;Choi, Sungwook;Chollet, Matthieu;Cook, Philip K.;Folsom, Eric;Galtier, Eric;Gonzalez, Arnulfo;Gorkhover, Tais;Guillet, Serge;Haldrup, Kristoffer;Howard, Marylesa;Katagiri, Kento;Kim, Seonghan;Kim, Sunam;Kim, Sungwon;Kim, Hyunjung;Knudsen, Erik Bergbaeck;Kuschel, Stephan;Lee, Hae Ja;Lin, Chuanlong;Mcwilliams, R. Stewart;Nagler, Bob;Nielsen, Martin Meedom;Ozaki, Norimasa;Pal, Dayeeta;Pedro, Ricardo Pablo;Saunders, Alison M.;Schoofs, Frank;Sekine, Toshimori;Simons, Hugh;van Driel, Tim;Wang, Bihan;Yang, Wenge;Yildirim, Can;Poulsen, Henning Friis;Eggert, Jon H.
固体材料中的结构、应变场和缺陷分布是众多应用中机械和物理性能的基础。许多现代微观结构显微镜工具表征需要映射晶格畸变或变形的晶粒、域和缺陷，但仅限于（近）表面的研究。一般来说，这样的工具不能探测的结构动力学的方式，是批量行为的代表。基于同步加速器X射线衍射的成像技术长期以来一直在绘制深嵌入的结构元素，随着分辨率的提高，暗场X射线显微镜（DFXM）现在可以以必要的nm分辨率绘制这些特征。然而，由于光源和光学器件的限制，这些技术仍然受到所需积分时间的影响。这项工作将DFXM扩展到X射线自由电子激光器，显示了这些源的每个脉冲的光子如何提供低至100 fs分辨率的结构表征（比当前同步加速器图像快几个数量级）。我们介绍了XFEL DFXM设置与同时明场显微镜探测密度变化在同一体积内。这项工作提出了一个全面的指南，我们在两个XFEL构建和测试的多模态超快高分辨率X射线显微镜，并显示了初步数据，展示了两种时序策略，以研究相关的可逆或不可逆的晶格动力学。
The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, dark field X-ray microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.
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影响因子：
6.1
作者：
Holstad, Theodor Secanell;Raeder, Trygve Magnus;Poulsen, Henning Friis
通讯作者：
Poulsen, Henning Friis
影响因子：
16.6
作者：
Kim D;Chung M;Carnis J;Kim S;Yun K;Kang J;Cha W;Cherukara MJ;Maxey E;Harder R;Sasikumar K;K R S Sankaranarayanan S;Zozulya A;Sprung M;Riu D;Kim H
通讯作者：
Kim H
DOI：
10.1016/j.nima.2005.05.010
发表时间：
2005-07-21
影响因子：
1.4
作者：
Ishikawa, T;Tamasaku, K;Yabashi, M
通讯作者：
Yabashi, M
影响因子：
2.5
作者：
通讯作者：
--
影响因子：
35
作者：
Gorkhover, Tais;Schorb, Sebastian;Bostedt, Christoph
通讯作者：
Bostedt, Christoph