Examination of Spontaneous Orientation Polarization in Wet‐Processed Tris(8‐hydroxyquinolinato)aluminum Film Measured by Rotary Kelvin Probe Method
Examination of Spontaneous Orientation Polarization in Wet‐Processed Tris(8‐hydroxyquinolinato)aluminum Film Measured by Rotary Kelvin Probe Method
复制标题
用旋转开尔文探针法测量湿法加工的三(8-羟基喹啉)铝膜的自发取向偏振
DOI：
10.1002/pssa.202000790
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发表时间：
2021
期刊：
影响因子：
--
通讯作者：
Ishii Hisao
中科院分区：
文献类型：
--
作者：
Ohara Masahiro;Watanabe Tatsuya;Tanaka Yuya;Ishii Hisao
近年来，自发取向极化（SOP）作为提高有机发光器件性能的重要因素引起了广泛关注。然而，到目前为止，SOP仅针对通过真空气相沉积制造的薄膜进行了报道，并且没有直接尝试检查湿法加工薄膜的SOP的存在。为了检查这种现象，有必要完全排除样品系统中的光照射，因为光载流子可以减少或消除由SOP形成引起的表面电势。在此，使用新型旋转开尔文探针法研究了在氧化铟锡基底上湿法处理的三（8-羟基喹啉）铝（Alq 3）膜的SOP。在全暗条件下进行成膜和表面电位测量。对于1 μm厚的Alq 3膜，观察到−0.33 V的表面电位漂移，表明与真空蒸发膜相比，湿法处理的Alq 3膜的SOP可以忽略不计。
Recently, a spontaneous orientation polarization (SOP) has attracted much attention as an important factor improving the performance of organic light‐emitting devices. However, so far, SOP is reported only for films fabricated by vacuum vapor deposition, and no direct attempt is made to examine the existence of SOP for wet‐processed film. To examine this phenomenon, it is necessary to completely exclude light illumination in the sample system, as photocarriers can reduce or eliminate the surface potential caused by the SOP formation. Herein, the SOP of wet‐processed tris(8‐hydroxyquinolinato)aluminum (Alq3) film on an indium‐tin‐oxide substrate is investigated using a novel rotary Kelvin probe method. Film formation and surface potential measurement are conducted under completely dark condition. A surface potential shift of −0.33 V is observed for a 1 μm thick film of Alq3, indicating that the SOP of wet‐processed Alq3film is negligible, in contrast to vacuum‐evaporated film.
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影响因子：
3.2
作者：
Ito, E;Washizu, Y;Seki, K
通讯作者：
Seki, K
影响因子：
3.2
作者：
Isoshima, Takashi;Okabayashi, Youichi;Han, Jin Wook
通讯作者：
Han, Jin Wook
高灵敏度光电子直接检测极性Alq3薄膜中残留负载流子的显着弛豫
影响因子：
2.3
作者：
Hiroumi Kinjo;Hyunsoo Lim;Tomoya Sato;Yutaka Noguchi;Yasuo Nakayama;and Hisao Ishii
通讯作者：
and Hisao Ishii
测量功函数差异的开尔文方法的简单修改
DOI：
10.1088/0022-3735/8/1/024
发表时间：
1975
期刊：
Journal of Physics E: Scientific Instruments
影响因子：
--
作者：
M. G. McKay;R. C. Dougal
通讯作者：
R. C. Dougal
使用旋转动态电容器测量表面电位
DOI：
10.1088/0022-3735/4/7/011
发表时间：
1971
期刊：
Journal of Physics E: Scientific Instruments
影响因子：
--
作者：
J. C. Mitchinson;R. D. Pringle;W. Farvis
通讯作者：
W. Farvis