Distinct Gaussian Properties of Multiple Reflections in Extended Hemispherical Lenses

Distinct Gaussian Properties of Multiple Reflections in Extended Hemispherical Lenses
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扩展半球透镜中多次反射的独特高斯特性

DOI:
10.1007/s10762-019-00632-x
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发表时间:
2019
期刊:
and Terahertz Waves
影响因子:
--
通讯作者:
Sertel, Kubilay
Sertel, Kubilay
中科院分区:
--
文献类型:
--
作者:
Ozbey, Burak;Sertel, Kubilay

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在扩展的半球形透镜的多次反射显示出明显不同的高斯字符。它表明,在电大透镜内的电磁场的第二和第三阶反弹的结果与斑点的大小和位置,是不相关的基本高斯光束状辐射从一个小天线位于透镜焦点的贡献。我们介绍了这种高阶透镜反射的光学特性(束腰处的高斯性和功率级)。这些反射对一个典型的准光学光谱设置的影响进行了讨论。计算相对接收功率密度,并与每个高阶反射的测量值进行比较。测量和理论之间的协议表明,所采用的方法是一个可靠的和有效的工具,从扩展的半球形透镜的主要反射的表征。
Multiple reflections in an extended hemispherical lens are shown to exhibit distinctly different Gaussian characters. It is demonstrated that the second- and third-order bounces of the electromagnetic fields within the electrically large lens result in contributions with spot sizes and locations that are uncorrelated with the fundamental Gaussian-beam-like radiation from a small antenna located at the lens focus. We present the optical properties (Gaussicities and power levels at the beam waist) of such higher-order lens reflections. The impacts of these reflections on a typical quasi-optical spectroscopy setup are discussed. The relative received power densities are computed and compared with measurements for each higher-order reflection. The agreement between the measurement and theory indicates that the adopted method is a reliable and efficient tool for characterization of the dominant reflections from extended hemispherical lenses.
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