Probabilistic sensitization analysis for variation-aware path delay fault test evaluation
Probabilistic sensitization analysis for variation-aware path delay fault test evaluation
复制标题
变化感知路径延迟故障测试评估的概率敏化分析
DOI：
--
复制
发表时间：
2017
期刊：
影响因子：
--
通讯作者：
H. Wunderlich
中科院分区：
文献类型：
--
作者：
Marcus Wagner;H. Wunderlich
随着近年来工艺节点工艺可变性的不断增加，数字集成电路的路径延迟故障测试已成为一大挑战。随机选择的长路径通常没有健壮的测试，许多现有的非健壮的测试可能会因为过程变化而无效。为了生成对工艺变化更容忍的路径延迟故障测试，延迟测试生成必须评估不同的非稳健测试，并且必须仅选择在存在工艺变化的情况下以足够高的概率敏化目标路径的那些测试。这需要对大量的目标路径进行大量的概率计算，并使得开发非常有效的近似算法对于任何实际应用都是强制性的。本文提出了一种新颖而有效的概率敏化分析方法，用于提取给定测试向量对的一个小的子电路。通过对子电路的蒙特卡罗模拟，有效地计算了目标路径被矢量对敏化的概率，并且没有显著误差。
With the ever increasing process variability in recent technology nodes, path delay fault testing of digital integrated circuits has become a major challenge. A randomly chosen long path often has no robust test and many of the existing non-robust tests are likely invalidated by process variations. To generate path delay fault tests that are more tolerant towards process variations, the delay test generation must evaluate different non-robust tests and only those tests that sensitize the target path with a sufficiently high probability in presence of process variations must be selected. This requires a huge number of probability computations for a large number of target paths and makes the development of very efficient approximation algorithms mandatory for any practical application. In this paper, a novel and efficient probabilistic sensitization analysis is presented which is used to extract a small subcircuit for a given test vector-pair. The probability that a target path is sensitized by the vector-pair is computed efficiently and without significant error by a Monte-Carlo simulation of the subcircuit.
用于变化感知测试生成的延迟故障检测概率的增量计算
DOI：
10.1109/ets.2014.6847805
发表时间：
--
期刊：
2014 19th IEEE European Test Symposium (ETS)
影响因子：
--
作者：
Wagner;Wunderlich
通讯作者：
Wunderlich