Genetic variation in N-use efficiency and associated traits in Indian wheat cultivars.
Genetic variation in N-use efficiency and associated traits in Indian wheat cultivars.
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DOI：
10.1016/j.fcr.2018.06.002
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发表时间：
2018-08-01
影响因子：
5.8
通讯作者：
Foulkes MJ
中科院分区：
文献类型：
--
作者：
Nehe AS;Misra S;Murchie EH;Chinnathambi K;Foulkes MJ
品种籽粒产量对开花期氮素吸收与氮素限制的反应。30个小麦品种的氮素利用效率与旗叶衰老时间相关。旗叶衰老时间与开花期氮素积累量相关。氮胁迫作物的产量受粮源容量的限制。氮（N）肥料代表种植者的显著成本，并且还可能通过与反硝化相关的硝酸盐浸出和N2 O（温室气体）排放而具有环境影响。本研究的目的是量化印度春小麦品种氮素利用效率（NUE）的遗传变异性，并确定改良NUE的育种应用性状。在印度的马哈拉施特拉邦，对28个面包小麦品种和2个硬粒小麦品种进行了两年的田间试验。在开花期和收获期进行详细的生长分析，包括干物质（DM）和N分配。从开花至完成旗叶衰老每3-4天从视觉评分评估旗叶的衰老，并拟合热时间以估计开花后衰老的开始和结束。在低氮（LN）条件下，籽粒产量（戈伊）平均减少1.46 t ha−1（−28%）。籽粒产量和氮素利用效率存在显著的N ×基因型互作效应。收获时的小麦地上部氮吸收量从高氮（HN）条件下的162 kg N ha−1减少到低氮（LN）条件下的85 kg N ha−1，而氮利用效率（收获时单位作物氮吸收量的谷物DM产量; NUtE）从32.7 kg DM kg−1 N增加到44.6 kg DM kg−1 N。LN处理下戈伊的遗传变异主要与收获期吸氮量相关，而与NUtE无关，戈伊的N ×基因型效应主要通过收获期吸氮量的互作来解释。不同品种旗叶衰老起始时间与戈伊的线性回归均达显著水平（R2 0.16）。p < 0.05）和LN（R2 0.21，p < 0.05）条件下。在HN（R2 0.34，p < 0.001）和LN（R2 0.22，p <0.01）条件下，旗叶衰老的开始与开花时的氮吸收正相关。旗叶衰老时间与花后氮素吸收无关。它的结论是，在开花期增加的N积累与旗叶衰老的时间，在开花期的N积累是一个重要的性状，为提高粮食产量和NUE的小麦生长在印度低到中等的N供应。
Cultivar grain yield responses to N limitation associated with N uptake at anthesis. N-use efficiency in thirty wheat cultivars was correlated with timing of flag-leaf senescence. Flag-leaf senescence timing was correlated with N accumulation at anthesis. The yield in N stressed crops was limited by grain source capacity. Nitrogen (N) fertilizer represents a significant cost for the grower and may also have environmental impacts through nitrate leaching and N2O (a greenhouse gas) emissions associated with denitrification. The objectives of this study were to quantify the genetic variability in N-use efficiency (NUE) in Indian spring wheat cultivars and identify traits for improved NUE for application in breeding. Twenty eight bread wheat cultivars and two durum wheat cultivars were tested in field experiments in two years in Maharashtra, India. Detailed growth analysis was conducted at anthesis and harvest including dry matter (DM) and N partitioning. Senescence of the flag leaf was assessed from a visual score every 3–4 days from anthesis to complete flag-leaf senescence and fitted against thermal time to estimate the onset and end of post-anthesis senescence. Grain yield (GY) was reduced under low N (LN) by an average of 1.46 t ha−1 (−28%). Significant N × genotype level interaction was observed for grain yield and NUE. Above-ground N uptake at harvest was reduced from 162 kg N ha−1 under high N (HN) to 85 kg N ha−1 under low N (LN) conditions, while N-utilization efficiency (grain DM yield per unit crop N uptake at harvest; NUtE) increased from 32.7 to 44.6 kg DM kg−1 N. Genetic variation in GY under LN related mainly to variation in N uptake at harvest rather than NUtE; and the N × genotype effect for GY was mainly explained by the interaction for N uptake at harvest. Averaging across years, the linear regression of onset of flag-leaf senescence on GY amongst cultivars was significant under both HN (R2 0.16. p < 0.05) and LN (R2 0.21, p < 0.05) conditions. Onset of flag-leaf senescence was positively associated with N uptake at anthesis under HN (R2 0.34, p < 0.001) and LN (R2 0.22, p < 0.01) conditions. Flag-leaf senescence timing was not associated with post-anthesis N uptake. It is concluded that increased N accumulation at anthesis was correlated with flag-leaf senescence timing and that N accumulation at anthesis is an important trait for enhancing grain yield and NUE of wheat grown under low to moderate N supply in India.
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影响因子：
2
作者：
BARRACLOUGH, PB
通讯作者：
BARRACLOUGH, PB
影响因子：
2.1
作者：
Chen, Chengci;Han, Guoqiang;Westcott, Malvern
通讯作者：
Westcott, Malvern
影响因子：
4.9
作者：
Ford, K. E.;Gregory, P. J.;Pepler, S.
通讯作者：
Pepler, S.
影响因子：
5.2
作者：
Le Gouis, J;Béghin, D;Pluchard, P
通讯作者：
Pluchard, P
DOI：
10.1080/14620316.1999.11511187
发表时间：
1999-11-01
影响因子：
1.9
作者：
Genard, M;Reich, M;Besset, J
通讯作者：
Besset, J