Integration of nanoimprint lithography with block copolymer directed self-assembly for fabrication of a sub-20 nm template for bit-patterned media
Integration of nanoimprint lithography with block copolymer directed self-assembly for fabrication of a sub-20 nm template for bit-patterned media
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纳米压印光刻与嵌段共聚物定向自组装相结合,用于制造位图介质的亚 20 nm 模板
DOI:
10.1088/0957-4484/25/39/395301
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发表时间:
2014
期刊:
影响因子:
3.5
通讯作者:
D. Kuo
中科院分区:
文献类型:
--
作者:
Xiaoming Yang;S. Xiao;Wei Hu;J. Hwu;R. V. D. van de Veerdonk;K. Wago;Kim Y. Lee;D. Kuo
We propose a novel strategy to integrate the nanoimprint lithography (NIL) technique with directed self-assembly (DSA) of block copolymer (BCP) for providing a robust, high-yield, and low-defect-density path to sub-20 nm dense patterning. Through this new NIL-DSA method, UV nanoimprint resist is used as the DSA copolymer pre-pattern to expedite the DSA process. This method was successfully used to fabricate a 1.0 Td in−2 servo-integrated nanoimprint template for bit-patterned media (BPM) application. The fabricated template was used for UV-cure NIL on a 2.5-inch disk. The imprint resist patterns were further transferred into the underlying CoCrPt magnetic layer through a carbon hard mask using ion beam etching. The successful integration of the NIL technique with the DSA process provides us with a new route to BPM nanofabrication, which includes the following three major advantages: (1) a simpler and faster way to implement DSA for high-density BPM patterning; (2) a novel method for fabricating a high-quality dot pattern template through an iterative imprint-DSA-template procedure; and (3) an uncomplicated integration scheme for implementing non-periodic servo features with BCP patterns, thus accelerating the transition of moving the DSA technique from laboratory research to the BPM manufacturing environment.
DOI:
--
发表时间:
2006
期刊:
Journal of Photopolymer Scinece and Technology 19
影响因子:
--
作者:
三浦陽子;他;T. Yamaguchi
通讯作者:
T. Yamaguchi