PATH: evaluation of boolean logic using path-based in-memory computing
PATH: evaluation of boolean logic using path-based in-memory computing
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PATH:使用基于路径的内存计算评估布尔逻辑
DOI:
10.1145/3489517.3530596
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发表时间:
2022
期刊:
影响因子:
--
通讯作者:
Ewetz, Rickard
中科院分区:
文献类型:
--
作者:
Thijssen, Sven;Jha, Sumit Kumar;Ewetz, Rickard
Processing in-memory breaks von Neumann-based constructs to accelerate data-intensive applications. Noteworthy efforts have been devoted to executing Boolean logic using digital in-memory computing. The limitation of state-of-the-art paradigms is that they heavily rely on repeatedly switching the state of the non-volatile resistive devices using expensive WRITE operations. In this paper, we propose a new in-memory computing paradigm called path-based computing for evaluating Boolean logic. Computation within the paradigm is performed using a one-time expensive compile phase and a fast and efficient evaluation phase. The key property of the paradigm is that the execution phase only involves cheap READ operations. Moreover, a synthesis tool called PATH is proposed to automatically map computation to a single crossbar design. The PATH tool also supports the synthesis of path-based computing systems where the total number of crossbars and the number of inter-crossbar connections are minimized. We evaluate the proposed paradigm using 10 circuits from the RevLib benchmark suite. Compared with state-of-the-art digital in-memory computing paradigms, path-based computing improves energy and latency up to 4.7X and 8.5X, respectively.
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DOI:
--
发表时间:
2015
期刊:
IEEE/ACM International Symposium on Nanoscale Architectures
影响因子:
--
作者:
Alvaro Velasquez;Sumit Kumar Jha
通讯作者:
Sumit Kumar Jha
DOI:
10.1007/s00339-015-9208-y
发表时间:
2015-05
期刊:
Applied Physics A
影响因子:
--
作者:
Miao Wang;X. Lian;Yiming Pan;Junwen Zeng;Chengyun Wang;Erfu Liu;Baigeng Wang;J. Yang;F. Miao;Dingyu Xing
通讯作者:
Miao Wang;X. Lian;Yiming Pan;Junwen Zeng;Chengyun Wang;Erfu Liu;Baigeng Wang;J. Yang;F. Miao;Dingyu Xing
DOI:
10.23919/date51398.2021.9473995
发表时间:
2021
期刊:
Design Automation and Test in Europe Conference (DATE
影响因子:
--
作者:
Thijssen, Sven;Jha, Sumit Kumar;Ewetz, Rickard
通讯作者:
Ewetz, Rickard
DOI:
--
发表时间:
2020
期刊:
2020 IEEE/ACM International Conference On Computer Aided Design (ICCAD)
影响因子:
--
作者:
Debjyoti Bhattacharjee;A. Chattopadhyay;Srijit Dutta;R. Ronen;Shahar Kvatinsky
通讯作者:
Shahar Kvatinsky
影响因子:
2.4
作者:
G. Pedretti;P. Mannocci;S. Hashemkhani;V. Milo;O. Melnic;E. Chicca;D. Ielmini
通讯作者:
D. Ielmini