Generation of surface acoustic waves on doped semiconductor substrates

Generation of surface acoustic waves on doped semiconductor substrates
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在掺杂半导体衬底上产生表面声波

DOI:
10.1088/1361-6463/aa92a5
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发表时间:
2017
期刊:
Journal of Physics D: Applied Physics
影响因子:
--
通讯作者:
P. V. Santos
P. V. Santos
中科院分区:
--
文献类型:
--
作者:
M. Yuan;C. Hubert;S. Rauwerdink;A. Tahraoui;B. van Someren;K. Biermann;P. V. Santos

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我们报道了在掺杂半导体衬底上表面声波(saw)的产生。这是通过将数字间换能器(IDTs)放置在溅射到蒸发薄金属层上的压电ZnO薄膜上来实现的。研究了ZnO/Au/GaAs和ZnO/Ni/InP两种材料体系。施加到换能器上的rf场被ZnO薄膜下面的高导电性金属薄膜电屏蔽,没有任何额外的欧姆损失。因此,避免了移动载波在IDT下的有损耗掺杂区域吸收射频场,确保了有效的SAW生成。我们发现金属层上ZnO薄膜的生长温度会影响其结构,从而影响SAW的生成效率。利用该技术,SAW有源层可以靠近掺杂层放置,扩大了SAW在半导体器件中的应用范围。
We report on the electrical generation of surface acoustic waves (SAWs) on doped semiconductor substrates. This is implemented by using interdigital transducers (IDTs) placed on piezoelectric ZnO films sputtered onto evaporated thin metal layers. Two material systems are investigated, namely ZnO/Au/GaAs and ZnO/Ni/InP. The rf-field applied to the transducer is electrically screened by the highly conductive metal film underneath the ZnO film without any extra ohmic losses. As a result, absorption of the rf-field by the mobile carriers in the lossy doped region underneath the IDT is avoided, ensuring efficient SAW generation. We find that the growth temperature of the ZnO film on the metal layer affects its structure and, thus, the efficiency of SAW generation. With this technique, the SAW active layers can be placed close to doped layers, expanding the application range of SAWs in semiconductor devices.
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