Design and Evaluation of a Spark Gap Based EM-fault Injection Setup
Design and Evaluation of a Spark Gap Based EM-fault Injection Setup
复制标题
基于火花隙的电磁故障注入装置的设计和评估
DOI：
10.1109/emcsi38923.2020.9191455
复制
发表时间：
2020
期刊：
影响因子：
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通讯作者：
Verbauwhede Ingrid
中科院分区：
文献类型：
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作者：
Beckers Arthur;Kinugawa Masahiro;Hayashi Yuichi;Balasch Josep;Verbauwhede Ingrid
现场运行的电子设备的快速和广泛部署使安全问题成为人们关注的焦点。例如，故障注入是一类攻击，允许攻击者通过篡改设备的正常功能来绕过安全相关功能。在本文中，我们描述了一种能够通过将集成电路暴露于脉冲磁场来使集成电路发生故障的装置。磁场是通过对注入探针上的传输线制成的脉冲形成网络进行放电而产生的。放电由基于火花隙的开关触发。我们描述了不同电路组件背后的机制，并在实践中评估设置的性能。据我们所知，这是第一次使用火花隙开关来构建电磁 (EM) 脉冲故障注入装置。
The rapid and widespread deployment of electronic devices operating in the field is bringing security issues into the spotlight. Fault injection, for instance, is a class of attacks that allows adversaries to bypass security-related capabilities by tampering with the normal functioning of a device. In this paper we describe a setup capable of faulting integrated circuits by exposing them to a pulsed magnetic field. The magnetic field is generated by discharging a pulse forming network made from a transmission line over an injection probe. The discharge is triggered by a spark gap based switch. We describe the mechanisms behind the different circuit components and evaluate the performance of the setup in practice. To the best of our knowledge, this is the first time a spark gap switch is used to build an electromagnetic (EM) pulse fault injection setup.
DOI：
10.1109/dcis.2017.8311630
发表时间：
2017
期刊：
2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS)
影响因子：
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作者：
J. Balasch;D. Arumí;S. Manich
通讯作者：
S. Manich