Ionizing Radiation Effects Spectroscopy for Analysis of Single-Event Transients

Ionizing Radiation Effects Spectroscopy for Analysis of Single-Event Transients
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用于分析单粒子瞬变的电离辐射效应光谱

DOI:
10.1109/tns.2019.2950385
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发表时间:
2020
影响因子:
1.8
通讯作者:
McMorrow, D.
McMorrow, D.
中科院分区:
工程技术3区
文献类型:
--
作者:
Loveless, T. D.;Patel, B.;Reising, D. R.;Roca, R.;Allen, M.;Massengill, L. W.;McMorrow, D.

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相似文献

电离辐射效应谱(IRES)的表征单粒子瞬态(SET)在空间部署的电子设备进行了演示。IRES通过统计分析增强了时频光谱技术,可以捕捉电路动态的细微变化。这是说明通过使用从双光子吸收激光实验上的锁相环(PLL)设计和制造的130 nm CMOS技术,并进一步解释通过使用行为建模的PLL的实验数据。该技术利用离散窗口分析的计算优势,需要低至0.2%的高分辨率离散傅立叶变换分析所需的数据样本,同时提供了一种统计方法,用于准确估计SET特性。
Ionizing radiation effects spectroscopy (IRES) for characterization of single-event transients (SETs) in space-deployed electronics is demonstrated. IRES enhances time-frequency spectroscopy techniques with statistical analysis, allowing for the capture of subtle changes in circuit dynamics. This is illustrated through the use of experimental data captured from two-photon absorption laser experiments on a phase-locked loop (PLL) designed and fabricated in a 130 nm CMOS technology, and further explained through the use of behavioral modeling of the PLL. The technique leverages the computational benefits of discrete windowed analysis, requiring as little as 0.2% of the data samples required in high-resolution discrete Fourier transform analysis while providing a statistical method for accurately estimating the SET characteristics.
模拟和混合信号电路的单事件缓解技术
DOI: --
发表时间: 2018
期刊:
影响因子: --
作者:
M. Bagatin;S. Gerardin
通讯作者: S. Gerardin
DOI: 10.1109/tns.2002.805400
发表时间: 2002
影响因子: 1.8
作者:
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通讯作者: Y. Boulghassoul;L. Massengill;A. Sternberg;R. Pease;S. Buchner;J. Howard;D. McMorrow;M. Savage;C. Poivey
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发表时间: 2015-03-01
影响因子: 5.9
作者:
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