Factory quality assurance of passive radiotherapy intensity modulators for electrons using kilovoltage x-ray imaging.
Factory quality assurance of passive radiotherapy intensity modulators for electrons using kilovoltage x-ray imaging.
复制标题
使用Kilovoltage X射线成像对电子的被动放疗强度调节器的工厂质量保证。
DOI:
10.1002/acm2.13943
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发表时间:
2023-07
影响因子:
2.1
通讯作者:
Hogstrom, Kenneth R.
中科院分区:
文献类型:
--
作者:
McGuffey, Andrew S.;Pitcher, Garrett M.;Guidry, Rebecca L.;Erhart, Kevin J.;Hogstrom, Kenneth R.
This work developed an x‐ray‐based method for performing factory quality assurance (QA) of Passive Radiotherapy Intensity Modulators for Electrons (PRIME) device fabrication. This method measures errors in position, diameter, and orientation of cylindrical island blocks on a hexagonal grid that comprises PRIME devices and the impact of such errors on the underlying intensity distribution. X‐ray images were acquired of six PRIME devices, which modeled three error cases (small random, large random, and systematic errors) for two island block diameters (0.158 and 0.352 cm). Island blocks in each device, 0.6 cm long tungsten cylinders of constant diameter, were spaced 0.6 cm on a hexagonal grid over approximately 8 cm square. Using a 50 kVp x‐ray image, each island block projected a racetrack, whose perimeter was fit to a function that allowed determination of its position, diameter, and angular orientation (θ, ϕ). These measured parameters were input into a pencil beam algorithm (PBA) dose calculation performed in water (16 MeV, SSD = 103 cm) for each device. PBA calculated intensity distributions using measured and planned (exact) island block parameters were compared. Θ distributions for the 0.158 and 0.352 cm devices were nearly identical for each error case, with θ values for most island blocks being within 3.2°, 8.5°, and 7.5° for the small random, large random, and systematic error PRIME devices, respectively. Corresponding intensity differences between using measured and planned island block parameters were within 1.0% and 2.8% (small random), 2.2% and 4.8% (large random), and 3.2% and 6.7% (systematic) for the 0.158 and 0.352 cm devices, respectively. This approach provides a viable and economical method for factory QA of fabricated PRIME devices by determining errors in their planned intensity distribution from which their quality can be assessed prior to releasing to the customer.
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影响因子:
2.1
作者:
Chambers EL;Carver RL;Hogstrom KR
通讯作者:
Hogstrom KR
影响因子:
2.1
作者:
Rusk BD;Carver RL;Gibbons JP;Hogstrom KR
通讯作者:
Hogstrom KR
影响因子:
2.1
作者:
Su S;Moran K;Robar JL
通讯作者:
Robar JL
影响因子:
2.1
作者:
Hilliard EN;Carver RL;Chambers EL;Kavanaugh JA;Erhart KJ;McGuffey AS;Hogstrom KR
通讯作者:
Hogstrom KR
影响因子:
2.1
作者:
Kudchadker, R J;Antolak, J A;Hogstrom, K R
通讯作者:
Hogstrom, K R