Quantitative imaging of ion transport through single nanopores by high-resolution scanning electrochemical microscopy.
Quantitative imaging of ion transport through single nanopores by high-resolution scanning electrochemical microscopy.
复制标题
DOI：
10.1021/ja3023785
复制
发表时间：
2012-06-20
影响因子：
15
通讯作者：
Amemiya, Shigeru
中科院分区：
文献类型：
--
作者：
Shen, Mei;Ishimatsu, Ryoichi;Kim, Jiyeon;Amemiya, Shigeru
在这里，我们报告了前所未有的高分辨率成像的离子传输通过单个纳米孔的扫描电化学显微镜（SECM）。单个纳米孔的定量SECM图像允许确定它们的结构特性，包括它们的密度、形状和尺寸，这对于理解整个纳米多孔膜的渗透性是必不可少的。纳米尺度的空间分辨率是通过扫描一个半径为17 nm的移液管尖端在一个高度多孔的纳米晶硅膜的距离下降到1.3 nm，以获得控制的四丁基铵的纳米孔介导的扩散传输到纳米移液管支持的液/液界面的峰值电流响应。280 nm × 500 nm图像分辨出13个纳米孔，相当于93个孔/µm2的高密度。进行SECM图像的有限元模拟以定量评估在分辨两个相邻孔时由尖端直径限制的空间分辨率，并确定纳米孔的实际尺寸，其近似为深度为30 nm且长轴和短轴分别为53 nm和41 nm的椭圆柱体。这些结构参数与TEM测定的结构参数一致，从而证实了纳米级定量SECM成像的可靠性。
Here, we report on the unprecedentedly high-resolution imaging of ion transport through single nanopores by scanning electrochemical microscopy (SECM). The quantitative SECM image of single nanopores allows for the determination of their structural properties, including their density, shape, and size, which are essential for understanding the permeability of the entire nanoporous membrane. Nanoscale spatial resolution was achieved by scanning a 17 nm-radius pipet tip at a distance down to 1.3 nm from a highly porous nanocrystalline silicon membrane in order to obtain the peak current response controlled by the nanopore-mediated diffusional transport of tetrabutylammonium to the nanopipet-supported liquid/liquid interface. A 280 nm × 500 nm image resolved 13 nanopores, which corresponds to a high density of 93 pores/µm2. A finite element simulation of the SECM image was performed to quantitatively assess the spatial resolution limited by the tip diameter in resolving two adjacent pores, and to determine the actual size of a nanopore, which was approximated as an elliptic cylinder with a depth of 30 nm and major and minor axes of 53 and 41 nm, respectively. These structural parameters are consistent with those determined by TEM, which thereby confirms the reliability of quantitative SECM imaging at the nanoscale level.
登录
查看更多内容
影响因子：
17.1
作者：
Gaborski TR;Snyder JL;Striemer CC;Fang DZ;Hoffman M;Fauchet PM;McGrath JL
通讯作者：
McGrath JL
影响因子：
17.1
作者：
Chen CC;Zhou Y;Baker LA
通讯作者：
Baker LA
影响因子：
7.4
作者：
Guo, JD;Amemiya, S
通讯作者：
Amemiya, S
影响因子：
7.4
作者：
Ervin, EN;White, HS;Baker, LA
通讯作者：
Baker, LA
影响因子：
7.4
作者：
Chen, Chiao-Chen;Derylo, Maksymilian A.;Baker, Lane A.
通讯作者：
Baker, Lane A.