Single-nanopore investigations with ion conductance microscopy.
Single-nanopore investigations with ion conductance microscopy.
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DOI:
10.1021/nn203205s
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发表时间:
2011-10-25
期刊:
影响因子:
17.1
通讯作者:
Baker LA
中科院分区:
文献类型:
--
作者:
Chen CC;Zhou Y;Baker LA
A three-electrode scanning ion conductance microscope (SICM) was used to investigate the local current-voltage properties of a single nanopore. In this experimental configuration, the response measured is a function of changes in the resistances involved in the pathways of ion migration. Single nanopore membranes utilized in this study were prepared with an epoxy painting procedure to isolate a single nanopore from a track-etch multi-pore membrane. Current-voltage responses measured with the SICM probe in the vicinity of a single nanopore were investigated in detail and agreed well with equivalent circuit models proposed in this study. With this modified SICM, the current-voltage responses characterized for the case of a single cylindrical pore and a single conical pore exhibit distinct conductance properties that originate from the geometry of nanopores.
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