Single-nanopore investigations with ion conductance microscopy.

Single-nanopore investigations with ion conductance microscopy.
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DOI:
10.1021/nn203205s
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发表时间:
2011-10-25
期刊:
影响因子:
17.1
通讯作者:
Baker LA
Baker LA
中科院分区:
材料科学1区
文献类型:
--
作者:
Chen CC;Zhou Y;Baker LA

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三电极扫描离子电导显微镜(SICM)被用来研究一个单一的纳米孔的局部电流-电压特性。在该实验配置中,测量的响应是离子迁移路径中涉及的电阻变化的函数。在本研究中使用的单纳米孔膜用环氧树脂涂覆程序制备,以从径迹蚀刻多孔膜分离单个纳米孔。详细研究了在单个纳米孔附近用SICM探针测量的电流-电压响应,并与本研究中提出的等效电路模型一致。与此修改的SICM,电流-电压响应的情况下,一个单一的圆柱形孔和一个单一的圆锥形孔的特征表现出不同的电导特性,源自纳米孔的几何形状。
A three-electrode scanning ion conductance microscope (SICM) was used to investigate the local current-voltage properties of a single nanopore. In this experimental configuration, the response measured is a function of changes in the resistances involved in the pathways of ion migration. Single nanopore membranes utilized in this study were prepared with an epoxy painting procedure to isolate a single nanopore from a track-etch multi-pore membrane. Current-voltage responses measured with the SICM probe in the vicinity of a single nanopore were investigated in detail and agreed well with equivalent circuit models proposed in this study. With this modified SICM, the current-voltage responses characterized for the case of a single cylindrical pore and a single conical pore exhibit distinct conductance properties that originate from the geometry of nanopores.
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