Low-Power Testing of Losses in Millimeter-Wave Transmission Lines for High-Power Applications.
Low-Power Testing of Losses in Millimeter-Wave Transmission Lines for High-Power Applications.
复制标题
DOI：
10.1007/s10762-008-9404-3
复制
发表时间：
2008-11
期刊：
影响因子：
--
通讯作者：
Rasmussen, D. A.
中科院分区：
文献类型：
--
作者：
Han, S. T.;Comfoltey, E. N.;Shapiro, M. A.;Sirigiri, J. R.;Tax, D. S.;Temkin, R. J.;Woskov, P. P.;Rasmussen, D. A.
We report the measurement of small losses in transmission line (TL) components intended for high-power millimeter-wave applications. Measurements were made using two different low-power techniques: a coherent technique using a vector network analyzer (VNA) and an incoherent technique using a radiometer. The measured loss in a 140 GHz 12.7 mm diameter TL system, consisting of 1.7 m of circular corrugated waveguide and three miter bends, is dominated by the miter bend loss. The measured loss was 0.3±0.1 dB per miter bend using a VNA; and 0.22±0.1 dB per miter bend using a radiometer. Good agreement between the two measurement techniques implies that both are useful for measuring small losses. To verify the methodology, the VNA technique was employed to measure the extremely small transmission loss in a 170 GHz ITER prototype TL system consisting of three lengths of 1 m, 63.5 mm diameter, circular corrugated waveguide and two miter bends. The measured loss of 0.05±0.02 dB per miter bend may be compared with the theoretical loss of 0.027 dB per miter bend. These results suggest that low-power testing of TL losses, utilizing a small, simple TL system and a VNA, is a reliable method for evaluating performance of low-loss millimeter-wave TL components intended for use in high-power applications.
登录
查看更多内容
影响因子：
--
作者：
MARCATILI, EAJ;SCHMELTZER, RA
通讯作者：
SCHMELTZER, RA
影响因子：
1.3
作者：
DOANE, JL;MOELLER, CP
通讯作者：
MOELLER, CP
影响因子：
1.7
作者：
Imai, T;Kobayashi, N;Alikaev, V
通讯作者：
Alikaev, V
影响因子：
0.9
作者：
Doane, J. L.
通讯作者：
Doane, J. L.
影响因子：
1.4
作者：
Krupnov, AF;Tretyakov, MY;Myasnikova, SE
通讯作者：
Myasnikova, SE