Fragmentation and adhesion properties of Cu-Zr amorphous thin films on polyimide substrates

Fragmentation and adhesion properties of Cu-Zr amorphous thin films on polyimide substrates
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聚酰亚胺基底上Cu-Zr非晶薄膜的碎裂和粘附性能

DOI:
10.1080/09500839.2019.1575529
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发表时间:
2018-10
影响因子:
1.2
通讯作者:
Sun J.
Sun J.
中科院分区:
材料科学4区
文献类型:
--
作者:
Wu K.;Wang Y. Q.;Yuan H. Z.;Zhang J. Y.;Liu G.;Sun J.

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摘要采用单轴拉伸试验,结合原位电阻率测量、光学显微镜和原子力显微镜,研究了不同膜厚Cu75Zr25非晶薄膜在聚酰亚胺基体上的断裂。结果表明,裂纹应变随减小而单调增大,这是由于薄膜厚度对剪切带形成和较厚薄膜中柱状结构的约束作用所致。Cu75Zr25非晶薄膜的屈曲应变也随应变能准则的变化而增大。Cu75Zr25薄膜与聚酰亚胺之间的粘附能估计为~ 6.5 J m−2。
ABSTRACT The fragmentation of Cu75Zr25 amorphous films with varying film thickness on polyimide substrates has been investigated by uniaxial tensile testing, in combination with in situ electrical resistivity measurements, optical microscopy and atomic force microscopy. It is revealed that the cracking strain monotonically increases as decreases, which can be attributed to the constraint effect of film thickness on shear band formation and the columnar structures in the thicker films. Similarly, the buckling strain also increases with decreasing , with the delamination of Cu75Zr25 amorphous films following the strain energy criterion. The adhesion energy between Cu75Zr25 film and polyimide is estimated to be of ∼ 6.5 J m−2 based on the buckle geometry.
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