Tilt scanning interferometry: a 3D k-space representation for depth-resolved structure and displacement measurement in scattering materials
Tilt scanning interferometry: a 3D k-space representation for depth-resolved structure and displacement measurement in scattering materials
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倾斜扫描干涉测量：用于散射材料中深度分辨结构和位移测量的 3D k 空间表示
DOI：
10.1117/12.870257
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发表时间：
2010
期刊：
影响因子：
--
通讯作者：
Galizzi G
中科院分区：
文献类型：
--
作者：
Galizzi G
双折射扫描干涉法（TSI）是近年来发展起来的一种测量非透明散射材料内部多分量位移场的实验方法。它可以被认为是散斑干涉测量在3D中的扩展，其中照射角度倾斜以提供深度信息，或者作为具有相位检测的光学衍射层析成像技术。它依赖于相位测量来提取位移信息，就像在通常的2D对应物中一样。最近发展了一个数值模型来模拟TSI中记录的散斑场，以研究相位和振幅如何受到诸如折射、吸收、散射、色散、应力-光学耦合和折射率的空间变化等因素的影响，所有这些因素都可能导致虚假位移。为了从TSI数据中提取深度分辨的结构和相位信息，该方法使用沿照明角轴沿着的强度调制信号的傅立叶变换。然而，事实证明，可以使用k空间中的传递函数的3D表示来实现对用于层析光学衍射的系统的成像特性的更完整的描述。根据这种形式主义，TSI被提出作为一个线性滤波操作。在本文中，我们描述了三维k空间中的TSI的传递函数，评估的三维点扩散函数和目前的模拟结果。
Tilt Scanning Interferometry (TSI) has been recently developed as an experimental method to measure multi-component displacement fields inside the volume of semitransparent scattering materials. It can be considered as an extension of speckle interferometry in 3D, in which the illumination angle is tilted to provide depth information, or as an optical diffraction tomography technique with phase detection. It relies on phase measurements to extract the displacement information, as in the usual 2D counterparts. A numerical model to simulate the speckle fields recorded in TSI has been recently developed to enable the study on how the phase and amplitude are affected by factors such as refraction, absorption, scattering, dispersion, stress-optic coupling and spatial variations of the refractive index, all of which may lead to spurious displacements. In order to extract depth-resolved structure and phase information from TSI data, the approach had been to use Fourier Transformation of the intensity modulation signal along the illumination angle axis. However, it turns out that a more complete description of the imaging properties of the system for tomographic optical diffraction can be achieved using a 3D representation of the transfer function in k-space. According to this formalism, TSI is presented as a linear filtering operation. In this paper we describe the transfer function of TSI in 3D k-space, evaluate the 3D point spread function and present simulated results.
影响因子：
1.9
作者：
G. Galizzi;P. D. Ruiz;G. H. Kaufmann
通讯作者：
G. Galizzi;P. D. Ruiz;G. H. Kaufmann
全息摄影、断层摄影和 3D 显微镜作为线性滤波操作
DOI：
--
发表时间：
2008
期刊：
影响因子：
--
作者：
J. Coupland;J. Lobera
通讯作者：
J. Lobera