Observation of tunneling gap in epitaxial ultrathin films of pyrite-type copper disulfide
Observation of tunneling gap in epitaxial ultrathin films of pyrite-type copper disulfide
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黄铁矿型二硫化铜外延超薄膜中隧道间隙的观察
DOI:
10.1088/0256-307x/35/2/027303
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发表时间:
2018-01
影响因子:
3.5
通讯作者:
Xue Qi-Kun
中科院分区:
文献类型:
--
作者:
Liu Chong;Yang Haohao;Song Can-Li;Li Wei;He Ke;Ma Xu-Cun;Wang Lili;Xue Qi-Kun
We report scanning tunneling microscopy investigation on epitaxial ultrathin films of pyrite-type copper disulfide. Layer by layer growth of CuS2 films with a preferential orientation of (111) on SrTiO3(001) and Bi2Sr2CaCu2O8+{\delta} substrates is achieved by molecular beam epitaxy growth. For ultrathin films on both kinds of substrates, we observed symmetric tunneling gap around Fermi level that persists up to ~ 15 K. The tunneling gap degrades with either increasing temperature or increasing thickness, suggesting new matter states at the extreme two dimensional limit.
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