Comparison of the noise performance of 10 GHz repetition rate quantum-dot and quantum well monolithic mode-locked semiconductor lasers

Comparison of the noise performance of 10 GHz repetition rate quantum-dot and quantum well monolithic mode-locked semiconductor lasers
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10 GHz 重复率量子点和量子阱单片锁模半导体激光器的噪声性能比较

DOI:
10.1049/iet-opt.2010.0058
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发表时间:
2011
影响因子:
1.6
通讯作者:
Carpintero G
Carpintero G
中科院分区:
计算机科学4区
文献类型:
--
作者:
Carpintero G

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锁模激光器由于具有良好的相位噪声性能而被广泛应用于载波信号产生系统中。由于这一关键参数的重要性,本研究对采用不同材料增益系统(一个量子阱和另一个量子点(QD))制造的两个器件的无源锁模区噪声性能进行了类似的比较,这两个器件都采用单片全主动双段锁模结构。两个重要的因素被确定为对噪声性能有显著影响,即第一谐波的射频线宽和噪声基座的形状,这两个因素都取决于被动锁模偏置条件。然而,射频线宽对相位噪声的主要贡献,对于QD激光器来说明显更窄,使得这种材料更适合于光产生低噪声毫米波载波频率。
Mode-locked lasers are commonly used in carrier-wave signal generation systems because of their excellent phase noise performance. Owing to the importance of this key parameter, this study presents a like-for-like comparison of the noise performance of the passive mode-locked regime of two devices fabricated with different material gain systems, one quantum well and the other quantum dot (QD), both with a monolithic all-active two-section mode-locked structure. Two important factors are identified as having a significant effect on the noise performance, the RF linewidth of the first harmonic and the shape of the noise pedestals, both depending on the passive mode-locked bias conditions. Nevertheless, the dominant contribution of the RF linewidth to the phase noise, which is significantly narrower for the QD laser, makes this material more suitable for optical generation of low-noise millimetre-wave carrier frequencies.
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