Development of Radiation-Hard Solid-State Amplifiers for Kilogray Environments Using COTS Components

Development of Radiation-Hard Solid-State Amplifiers for Kilogray Environments Using COTS Components
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使用 COTS 组件开发适用于千级环境的抗辐射固态放大器

DOI:
10.1109/tns.2019.2937603
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发表时间:
2019
影响因子:
1.8
通讯作者:
Paoluzzi Mauro
Paoluzzi Mauro
中科院分区:
工程技术3区
文献类型:
--
作者:
Ohmori Chihiro;Paoluzzi Mauro

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高光度大型强子对撞机(LHC)(HL-LHC)项目是LHC的升级,将其光度与标称值相比提高了5倍。LHC注入器升级(LIU)项目旨在升级LHC注入器链,以达到HL-LHC的目标。LIU项目涵盖所有注入器,即Linac 4,质子同步加速器(PS)助推器(PSB),PS和超级PS(SPS)。在PSB中,现有的铁氧体加载的RF加速系统将被磁性合金(Finemet)加载的腔系统所取代。腔系统允许蜂窝拓扑的实现和固态RF功率放大器的使用。PSB将有144个腔室和放大器,每个放大器使用17个高功率MOSFET。射频系统将安装在总电离剂量(TID)为20戈伊(Si)/年的直线段,升级后该剂量甚至可能增加。已经进行了研究和开发工作,以验证在这种放射性环境中使用固态放大器。在这篇文章中,我们描述了一种技术,以稳定的固态放大器高达约10 kGy的总剂量。这种技术将使固态放大器能够在更高的辐射环境中使用。横向扩散金属氧化物半导体(LDMOS)的单粒子效应(SEE)的灵敏度比垂直的金属氧化物半导体(VMOS)的设备也被报道。
The high-luminosity Large Hadron Collider (LHC) (HL-LHC) project is the upgrade of the LHC to increase its luminosity by a factor of 5 compared with the nominal value. The LHC injector upgrade (LIU) project aims at upgrading the LHC injector chain to reach the goal of the HL-LHC. The LIU project covers all injectors, that is, the Linac 4, proton synchrotron (PS) booster (PSB), PS, and super PS (SPS). In the PSB, the present ferrite-loaded RF accelerating systems will be replaced with magnetic alloy (Finemet)-loaded cavity systems. The cavity system allows the implementation of a cellular topology and the use of solid-state RF power amplifiers. The PSB will have 144 cavity cells and amplifiers, and each amplifier uses 17 high-power MOSFETs. The RF systems will be installed in the straight sections where the total ionization dose (TID) is 20 Gy(Si)/year, which may even increase after the upgrade. Research and development work has been performed to validate the use of solid-state amplifiers in this radioactive environment. In this article, we describe a technique to stabilize the solid-state amplifier up to the total dose of about 10 kGy. This technique will enable the use of solid-state amplifiers in even higher radiation environments. The higher sensitivity to the single-event effects (SEEs) of the laterally diffused metal-oxide semiconductors (LDMOS) than to that of the vertical metal-oxide-semiconductor (VMOS) devices is also reported.
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