Long-lived spin coherence in silicon with an electrical spin trap readout.
Long-lived spin coherence in silicon with an electrical spin trap readout.
复制标题
硅中的长寿命自旋相干性具有电自旋陷阱读数。
DOI:
10.1103/physrevlett.101.207602
复制
发表时间:
2008
影响因子:
8.6
通讯作者:
Morley GW
中科院分区:
文献类型:
--
作者:
Morley GW
Pulsed electrically detected magnetic resonance of phosphorous () in bulk crystalline silicon at very high magnetic fields () and low temperatures () is presented. We find that the spin-dependent capture and reemission of highly polarized (<?format ?>><?format ?>95%) conduction electrons by equally highly polarizeddonor electrons introduces less decoherence than other mechanisms for spin-to-charge conversion. This allows the electrical detection of spin coherence times in excess of, 50 times longer than the previous maximum for electrically detected spin readout experiments.
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影响因子:
8.6
作者:
GORDON, JP;BOWERS, KD
通讯作者:
BOWERS, KD
影响因子:
8.6
作者:
H. Huebl;F. Hoehne;Benno Grolik;A. Stegner;M. Stutzmann;M. Brandt
通讯作者:
M. Brandt
影响因子:
8.6
作者:
A. Yang;M. Steger;Denis Karaiskaj;M. Thewalt;Manuel Cardona;Kohei M. Itoh;Helge Riemann;Nikolay V. Abrosimov;M. F. Churbanov;A. Gusev;A. D. Bulanov;A. K. Kaliteevskiĭ;O. N. Godisov;P. Becker;H. Pohl;J. Ager;E. E. Haller
通讯作者:
E. E. Haller
影响因子:
3.7
作者:
D. McCamey;Gavin W. Morley;H. Seipel;L. Brunel;J. Tol;C. Boehme
通讯作者:
C. Boehme
DOI:
--
发表时间:
1973
期刊:
影响因子:
--
作者:
D. Thornton;A. Honig
通讯作者:
A. Honig