CoLA: Convolutional Neural Network Model for Secure Low Overhead Logic Locking Assignment
CoLA: Convolutional Neural Network Model for Secure Low Overhead Logic Locking Assignment
复制标题
CoLA:用于安全低开销逻辑锁定分配的卷积神经网络模型
DOI:
10.1145/3583781.3590219
复制
发表时间:
2023
期刊:
影响因子:
--
通讯作者:
Rezaei, Amin
中科院分区:
文献类型:
--
作者:
Aghamohammadi, Yeganeh;Rezaei, Amin
Chip designers can secure their ICs against piracy and overproduction by employing logic locking and obfuscation. However, there are numerous attacks that can examine the logic-locked netlist with the assistance of an activated IC and extract the correct key using a SAT solver. In addition, when it comes to fabrication, the imposed area overhead is a challenge that needs careful attention to preserve the design goals. Thus, to assign a logic locking method that can provide security against diverse attacks and at the same time add minimal area overhead, a comprehensive understanding of the circuit structure is needed. Towards this goal, in this paper, we first build a multi-label dataset by running different attacks on benchmarks locked with existing logic locking methods and various key sizes to capture the provided level of security and overhead for each benchmark. Then we propose and analyze CoLA, a convolutional neural network model that is trained on this dataset and thus is able to map circuits to secure low-overhead locking schemes by analyzing extracted features of the benchmark circuits. Considering various resynthesized versions of the same circuits empowers CoLA to learn features beyond the structure view alone. We use a quantization method that can lower the computation overhead of feature extraction in the classification of new, unseen data, hence speeding up the locking assignment process. Results on over 10000 data show high accuracy both in the training and validation phases.
登录
查看更多内容
DOI:
10.1109/tcsii.2021.3113035
发表时间:
2022
期刊:
IEEE Transactions on Circuits and Systems II: Express Briefs
影响因子:
--
作者:
Lilas Alrahis;Satwik Patnaik;Muhammad Shafique;O. Sinanoglu
通讯作者:
O. Sinanoglu
DOI:
10.23919/date.2019.8714924
发表时间:
2019
期刊:
Testing in Europe (DATE
影响因子:
--
作者:
Shen, Yuanqi;Li, You;Kong, Shuyu;Rezaei, Amin;Zhou, Hai
通讯作者:
Zhou, Hai
DOI:
10.1109/iccad.2017.8203759
发表时间:
2017-11
期刊:
2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
影响因子:
--
作者:
H. Zhou;Ruifeng Jiang;Shuyu Kong
通讯作者:
H. Zhou;Ruifeng Jiang;Shuyu Kong
DOI:
10.23919/date48585.2020.9116500
发表时间:
2020
期刊:
Testing in Europe (DATE
影响因子:
--
作者:
Rezaei, Amin;Shen, Yuanqi;Zhou, Hai
通讯作者:
Zhou, Hai
DOI:
10.1145/3060403.3060469
发表时间:
2017-05
期刊:
Proceedings of the Great Lakes Symposium on VLSI 2017
影响因子:
--
作者:
Yuanqi Shen;H. Zhou
通讯作者:
Yuanqi Shen;H. Zhou