Influence of Ti4+ substitution for Zr4+ on the structure and microwave dielectric properties of Pr2Zr3(MoO4)9 ceramic

Influence of Ti4+ substitution for Zr4+ on the structure and microwave dielectric properties of Pr2Zr3(MoO4)9 ceramic
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Ti4替代Zr4对Pr2Zr3(MoO4)9陶瓷结构和微波介电性能的影响

DOI:
10.1016/j.jallcom.2022.164986
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发表时间:
2022
影响因子:
6.2
通讯作者:
Zhenxing Yue
Zhenxing Yue
中科院分区:
材料科学2区
文献类型:
--
作者:
Lintao Liu;Xueli Ji;Haitao Wu;Jialun Du;Yuanyuan Zhou;Zhenxing Yue

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采用经典固相法制备了Pr2(Zr1−xTix)3(MoO4)9(0.02≤x≤0.10)组成的陶瓷。采用x射线衍射仪(XRD)、扫描电镜(SEM)、拉曼光谱(Raman)、红外光谱仪(FT-IR)和安捷伦矢量网络分析仪(Agilent vector network analyzer)分别研究了材料的相组成、显微结构、晶格振动、内部介电响应和介电性能。XRD分析表明,Pr2(Zr1−xTix)3(MoO4)9(0.02≤x≤0.10)陶瓷具有三角型晶体结构和R-3c空间基团,SEM图证实了最佳烧结温度为800℃。同时,该陶瓷在800℃,x = 0.10时,εr= 10.8,Q×f= 81539 GHz, τf= - 14.2 ppm/°C,达到最佳的微波介电性能。运用复杂晶体化学键理论(P-V-L理论),深入探讨了其与晶体结构和微波介电性能的关系。由于较低的烧结温度和优越的介电性能,Pr2(Zr0.90Ti0.10)3(MoO4)9陶瓷有望应用于低温共烧陶瓷(LTCC)。
Ceramics with composition of Pr2(Zr1−xTix)3(MoO4)9(0.02 ≤ x ≤ 0.10) were fabricated by classic solid-phase method. X-ray diffractometer (XRD), Scanning electron microscope (SEM), Raman spectra, FT-IR spectrometer and Agilent vector network analyzer were used to investigate the composition of phase, microscopy, lattice vibration, internal dielectric responding and dielectric properties, respectively. XRD indicates the Pr2(Zr1−xTix)3(MoO4)9(0.02 ≤ x ≤ 0.10) ceramics own trigonal-type crystal structure and R-3c space group and the SEM patterns confirms the optimal sintering temperature is 800 °C. Simultaneously, the ceramic reached the optimal microwave dielectric properties withεr= 10.8,Q×f= 81,539 GHz andτf= −14.2 ppm/°C at 800 °C for x = 0.10. By means of the theory of complex crystals chemical bonds (P-V-L theory), the connections with crystal structure and microwave dielectric properties were deeply discussed. Due to the relatively low fired temperature and superior dielectric properties, there is an expect for Pr2(Zr0.90Ti0.10)3(MoO4)9ceramic to apply in low temperature cofired ceramic (LTCC).
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