Degradation of thermal conductivity of the damaged layer of tungsten irradiated by helium-plasma
Degradation of thermal conductivity of the damaged layer of tungsten irradiated by helium-plasma
复制标题
氦等离子体辐照钨损伤层热导率的降低
DOI：
10.1016/j.fusengdes.2018.08.014
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发表时间：
2018-12
影响因子：
1.7
通讯作者：
Wei Liu
中科院分区：
文献类型：
--
作者：
Shilian Qu;Hao Sun;Arkadi Kreter;Yue Yuan;Long Cheng;Zhengxing Huang;Ben Xu;Wanqi Chen;Wei Cui;Zhenan Tang;Yuzhen Jia;YouYun Lian;Xiang Liu;Wei Liu
Pure tungsten samples were irradiated by helium plasma in the linear plasma device PSI-2 with an ion energy of 40 eV and a flux of 1.1 × 1022m−2s−1. The irradiation temperature was from 523 K to 773 K and the fluence was from 1.0 × 1025to 1.0 × 1026m−2. A damaged layer of 10 nm thickness was formed on the sample surface with a destroyed crystalline structure. Helium-bubbles and surface modification in nanoscale were observed. Thermal conductivities of the ultra-thin damaged layers were measured by the transient thermoreflectance technique. Result shows that the thermal conductivity reduced two orders of magnitude compared to the bulk value and decreased with increasing irradiation temperature and fluence. Moreover, the helium-irradiated samples were exposed to ELM-like heat load produced by electron beam on EMS-60. The pulse length was 1 ms and each sample was exposed to 5 pulses. Melting occurred under power density of 1.7 GW m−2. As the thermal conductivity of the damaged layer decreased, the molten bath of the irradiated sample deepened. The degraded thermal conductivity led to a lower melting threshold. The characterization of the thermal conductivity of the damaged layer induced by the plasma irradiation is a promising way to estimate the damage level, as well as the failure threshold, of the plasma facing components.
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影响因子：
2.5
作者：
K. Ujihara
通讯作者：
K. Ujihara
影响因子：
3.1
作者：
M. Miyamoto;S. Mikami;H. Nagashima;N. Iijima;D. Nishijima;R. Doerner;N. Yoshida;Hideo Watanabe;Y. Ueda;A. Sagara
通讯作者：
M. Miyamoto;S. Mikami;H. Nagashima;N. Iijima;D. Nishijima;R. Doerner;N. Yoshida;Hideo Watanabe;Y. Ueda;A. Sagara
影响因子：
--
作者：
Stevens, RJ;Smith, AN;Norris, PM
通讯作者：
Norris, PM
影响因子：
9.4
作者：
Chen, Tianyi;Gigax, Jonathan G.;Shao, Lin
通讯作者：
Shao, Lin
影响因子：
10.9
作者：
Zhengxing Huang;Zhenan Tang;Ziqiang Xu;H. Ding;Yuqin Gu
通讯作者：
Zhengxing Huang;Zhenan Tang;Ziqiang Xu;H. Ding;Yuqin Gu