Using highly accelerated life test to study insulation reliability of multi-layer ceramic capacitors sintered at different temperatures
Using highly accelerated life test to study insulation reliability of multi-layer ceramic capacitors sintered at different temperatures
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利用高加速寿命试验研究不同温度烧结多层陶瓷电容器的绝缘可靠性
DOI：
10.1063/5.0178304
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发表时间：
2023
影响因子：
3.2
通讯作者：
Genshui Wang
中科院分区：
文献类型：
--
作者：
Zhifei Wang;Shiguang Yan;Fei Cao;Zhichao Hong;Yuelong Xiong;Benxia Chen;Chenhong Xu;Genshui Wang
随着电子工业的发展，多层陶瓷电容器(MLCC)的平均无故障时间(MTTF)也在不断提高，以获得高的直流绝缘可靠性。然而，很少有研究找到合适的测量方法来定量评估它们不同的可靠性特性。本研究采用高速加速寿命试验(HALTS)测试了在三种不同温度下烧结的BaTiO_3基多层陶瓷电容器的不同可靠性特性。采用Kaplan-Meier生存分析法、两参数威布尔拟合法和一种新的基于种属遗传算法的方法计算了它们在停顿状态下的平均寿命，并进行了比较，以选择合适的拟合方法。采用适当的方法对它们在额定条件下的MTTF进行了预测和比较。它们的导电模式也不同，以解释它们对温度和电压的老化敏感性。建立了用浴缸曲线评价样品可靠性的方法，确定了额定条件下最佳的电容烧结温度和最佳的可靠性烧结温度。同时，也证明了MLCC不同的导电模式与其绝缘稳定性有关。
With the developments of the electronic industry, efforts to achieve high DC insulating reliability are underway to improve the mean time to failure (MTTF) of multilayer ceramic capacitors (MLCCs). However, there are few studies on appropriate measuring methods to evaluate their different reliability characteristics quantificationally. This study measured different reliability characteristics of BaTiO3-based multilayer ceramic capacitors sintered at three different temperatures with highly accelerated life tests (HALTs). Kaplan–Meier survival analysis, two-parameter Weibull fitting, and a new method using a stud genetic algorithm were used to calculate their MTTF in HALT conditions, and the comparison among them was carried out to select a proper fitting way. With the appropriate method, their MTTF at the rated condition was predicted and compared. Their conduction modes were also differentiated to explain their aging sensitivities to temperature and voltage. As a result, a proper way to evaluate the sample’s reliability characteristics with a bathtub curve was established, and the best sintering temperature for capacitance that is also the best for reliability at the rated condition was confirmed. Meanwhile, different conducting models of MLCCs were also proved to be related to their insulation stability.
金属-硅界面区域的空位形成能
DOI：
--
发表时间：
2005
期刊：
Japanese Journal of Applied Physics 44-19
影响因子：
--
作者：
M.Suezawa;K.Sato;K Kojima;A.Kasuya
通讯作者：
A.Kasuya