Closed loop adaptive optics for microscopy without a wavefront sensor.

Closed loop adaptive optics for microscopy without a wavefront sensor.
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DOI:
10.1117/12.840943
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发表时间:
2010-02-24
期刊:
Proceedings of SPIE--the International Society for Optical Engineering
影响因子:
--
通讯作者:
Sedat JW
Sedat JW
中科院分区:
其他
文献类型:
--
作者:
Kner P;Winoto L;Agard DA;Sedat JW

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一个小的荧光珠的三维宽场图像包含足够多的信息,以准确地计算波前在显微镜物镜后光瞳平面使用相位恢复技术。然后,相位恢复波前可以用于设置可变形反射镜,以校正显微镜的点扩散函数(PSF),而不使用波前传感器。这种技术将是有用的,在宽视场显微镜与自适应光学对准的变形镜,并可能被用来纠正小荧光珠或其他点源被用作参考信标的样品中的像差。另一个优点是与当前的Shack-Hartmann波前传感器相比,检索的波前的高分辨率。在这里,我们证明了在3次迭代中PSF的有效校正。从严重畸变的系统开始,我们实现了0.78的Strehl比和大于10倍的最大强度增加。
A three-dimensional wide-field image of a small fluorescent bead contains more than enough information to accurately calculate the wavefront in the microscope objective back pupil plane using the phase retrieval technique. The phase-retrieved wavefront can then be used to set a deformable mirror to correct the point-spread function (PSF) of the microscope without the use of a wavefront sensor. This technique will be useful for aligning the deformable mirror in a widefield microscope with adaptive optics and could potentially be used to correct aberrations in samples where small fluorescent beads or other point sources are used as reference beacons. Another advantage is the high resolution of the retrieved wavefont as compared with current Shack-Hartmann wavefront sensors. Here we demonstrate effective correction of the PSF in 3 iterations. Starting from a severely aberrated system, we achieve a Strehl ratio of 0.78 and a greater than 10-fold increase in maximum intensity.
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