Symmetrical positron annihilation lifetime spectrometer and single-sided measurements

Symmetrical positron annihilation lifetime spectrometer and single-sided measurements
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对称正电子湮灭寿命谱仪和单面测量

DOI:
10.1088/1748-0221/14/10/p10021
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发表时间:
2019-10
影响因子:
1.3
通讯作者:
Bangjiao Ye
Bangjiao Ye
中科院分区:
工程技术4区
文献类型:
--
作者:
L. H. Cong;Bingchuan Gu;X. X. Han;Ziwen Pan;J. Q. Guo;Bangjiao Ye

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正电子湮灭寿命(PAL)光谱是研究材料缺陷的有效工具。在常规系统和22Na放射源的基础上,研制了一种对称式PAL光谱仪。两种检测器都提供启动和停止信号,使计数率增加一倍,而无需添加设备。在测量过程中自动校准零通道位置,将两个子光谱结合起来,可以应用于具有更多探测器的大型系统。模拟了两个子光谱的零通道位置和时间分辨率的差异,验证了我们工作的可行性。然后我们使用聚酰亚胺薄膜(22Na源封装材料Kapton薄膜)作为参比样品,仅用一块被测样品(单面)采集PAL光谱。模拟了高强度和未知强度源分量的影响,以检验足够的计数和准确的源校正的重要性。对称式PAL光谱仪计数率更高,满足单面样品的要求。实验结果表明,我们的PAL光谱仪在双面和单面测量中都表现良好。
Positron annihilation lifetime (PAL) spectroscopy is a useful tool in material defect studies. In this work, a symmetrical PAL spectrometer was developed based on a conventional system and 22Na radioactive source. Both detectors provide start and stop signals to double the counting rate without adding devices. Zero-channel position is calibrated automatically during the measurement to combine the two sub-spectra, which can be applied to larger systems with more detectors. The differences of zero-channel positions and time resolutions of two sub-spectra were simulated to confirm the feasibility of our work. Then we used polyimide film (Kapton film, the packaging material of 22Na source) as reference sample to collect PAL spectra with only one piece of tested sample (single-sided). The influences of high and unknown intensity of source components were simulated to check the importance of enough counts and accurate source correction. Symmetrical PAL spectrometer provides higher counting rate to meet the requirement of single-sided sample. Experimental results confirmed that our PAL spectrometer performs well for both double-sided and single-sided measurements.
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