Focused-Ion-Beam-Milled Carbon Nanoelectrodes for Scanning Electrochemical Microscopy.
Focused-Ion-Beam-Milled Carbon Nanoelectrodes for Scanning Electrochemical Microscopy.
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用于扫描电化学显微镜的聚焦离子束式碳纳米电极。
DOI：
10.1149/2.0071604jes
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发表时间：
2016
影响因子：
3.9
通讯作者：
Amemiya S
中科院分区：
文献类型：
--
作者：
Chen R;Hu K;Yu Y;Mirkin MV;Amemiya S
纳米级扫描电化学显微镜（SECM）已经成为一种强大的电化学方法，能够以前所未有的高空间和动力学分辨率研究界面反应。在这项工作中，我们基于石英纳米管中的碳化学气相沉积，开发了具有高电化学反应性和良好控制尺寸和几何形状的碳纳米探针。利用聚焦离子束（FIB）技术对填充碳的纳米管进行铣削，得到了带有薄石英鞘的扁平盘状尖端，透射电子显微镜证实了这一点。通过Ru(NH3)63+≥10 cm/s的极高标准电子转移速率常数，可以定量地说明光纤铣削的碳纳米尖具有极高的电活性。在电解质溶液中，通过SECM方法曲线测量表征了尖端的尺寸和几何形状，不仅确定了内外尖端的半径分别为~27和~38 nm，而且确保了外壁上没有导电碳层。此外，fib研磨的碳纳米尖端揭示了~100 nm厚的金薄膜在纳米级质量输运条件下的有限导电性。重要的是，碳纳米尖端必须防止静电损坏，以实现可靠和定量的纳米电化学测量。
Nanoscale scanning electrochemical microscopy (SECM) has emerged as a powerful electrochemical method that enables the study of interfacial reactions with unprecedentedly high spatial and kinetic resolution. In this work, we develop carbon nanoprobes with high electrochemical reactivity and well-controlled size and geometry based on chemical vapor deposition of carbon in quartz nanopipets. Carbon-filled nanopipets are milled by focused ion beam (FIB) technology to yield a flat disk tip with a thin quartz sheath as confirmed by transmission electron microscopy. The extremely high electroactivity of FIB-milled carbon nanotips is quantified by enormously high standard electron-transfer rate constants of ≥10 cm/s for Ru(NH3)63+. The tip size and geometry are characterized in electrolyte solutions by SECM approach curve measurements not only to determine inner and outer tip radii of down to ~27 and ~38 nm, respectively, but also to ensure the absence of a conductive carbon layer on the outer wall. In addition, FIB-milled carbon nanotips reveal the limited conductivity of ~100 nm-thick gold films under nanoscale mass-transport conditions. Importantly, carbon nanotips must be protected from electrostatic damage to enable reliable and quantitative nanoelectrochemical measurements.
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影响因子：
7.4
作者：
Nioradze, Nikoloz;Kim, Jiyeon;Amemiya, Shigeru
通讯作者：
Amemiya, Shigeru
影响因子：
7.4
作者：
Guo, JD;Amemiya, S
通讯作者：
Amemiya, S
影响因子：
7.4
作者：
McKelvey, Kim;Nadappuram, Binoy Paulose;Actis, Paolo;Takahashi, Yasufumi;Korchev, Yuri E.;Matsue, Tomokazu;Robinson, Colin;Unwin, Patrick R.
通讯作者：
Unwin, Patrick R.
实时监测自我重建神经肌肉接头内的离散突触释放事件和兴奋电位（热点论文）
影响因子：
16.6
作者：
Li, Yu-Tao;Zhang, Shu-Hui;Huang, Wei-Hua
通讯作者：
Huang, Wei-Hua
DOI：
10.1146/annurev-anchem-062011-143124
发表时间：
2012-01-01
期刊：
ANNUAL REVIEW OF ANALYTICAL CHEMISTRY, VOL 5
影响因子：
--
作者：
Cox, Jonathan T.;Zhang, Bo
通讯作者：
Zhang, Bo