Determination of the distribution of elements with similar electron counts: a practical guide for resonant X‐ray scattering

Determination of the distribution of elements with similar electron counts: a practical guide for resonant X‐ray scattering
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确定具有相似电子数的元素分布:共振 X 射线散射实用指南

DOI:
10.1107/s0021889813008923
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发表时间:
2013
影响因子:
6.1
通讯作者:
O. Oeckler
O. Oeckler
中科院分区:
材料科学3区
文献类型:
--
作者:
S. Welzmiller;P. Urban;F. Fahrnbauer;L. Erra;O. Oeckler

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这篇文章试图提出简单易懂的指导方针,用于确定缺乏X射线散射衬度的化合物中的元素分布,因为它们具有相似的电子计数。比较了不同来源的反常色散校正项(特别是Δf′值)的适用性、可靠性和质量。将数据库中的值与荧光光谱计算的Δf值和单晶衍射数据的精确值进行比较,使用没有散射对比度问题的参考晶体和包含具有相似电子计数的元素的晶体。可靠地确定元素分布和最佳波长所需的数据集的数量进行了讨论。联合多数据集精化适用于缺乏散射对比度的元素的多重混合占位的精化。获得Δf′值的最直接方法取决于待解决问题的复杂性和所需的精度。
This article attempts to present straightforward and easy-to-understand guidelines for the determination of element distribution in compounds lacking X-ray scattering contrast because they have similar electron counts. Different sources of anomalous dispersion correction terms (especially Δf′ values) are compared with respect to their suitability, reliability and quality. Values from databases are compared with Δf values calculated from fluorescence spectra and those refined from single-crystal diffraction data, using both reference crystals without scattering contrast problems and crystals containing elements with similar electron counts. The number of data sets required to determine reliably the element distribution and the optimum wavelengths to be used are discussed. Joint multiple data set refinements are suitable for the refinement of multiply mixed occupancies of elements lacking scattering contrast. The most straightforward method of obtaining Δf′ values depends on the complexity of the problem to be solved and the precision required.
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