Integrated reflectivity measurements of hydrogen phthalate crystals for high-resolution soft x-ray spectroscopy
Integrated reflectivity measurements of hydrogen phthalate crystals for high-resolution soft x-ray spectroscopy
复制标题
用于高分辨率软 X 射线光谱的邻苯二甲酸氢晶体的集成反射率测量
DOI：
10.1088/1748-0221/9/09/p09008
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发表时间：
2014
影响因子：
1.3
通讯作者：
E. Förster
中科院分区：
文献类型：
--
作者：
U. Zastrau;E. Förster
利用双晶装置研究了光子能量为（1740±14）eV时邻苯二甲酸氢钾（KAP）和邻苯二甲酸氢铷（RAP）晶体的x射线综合反射率。当考虑吸收时，测得的绝对反射率与动态衍射理论对完美晶体的预测值的一致性小于5%。在4%的实验误差范围内，暴露在环境条件下多年的样品显示出与测量前切割的样品相同的反射率。切割10 μm的表面层与切割整个2mm厚度的晶体块之间没有差异。我们得出结论，在1.7 keV光子能量下，1 μm的穿透深度比10 nm的潜在恶化表面层要大。
The integrated x-ray reflectivity of Potassium Hydrogen Phthalate (KAP) and Rubidium Hydrogen Phthalate (RAP) crystals is studied at a photon energy of (1740±14) eV using a double-crystal setup. The absolute measured reflectivities are in < 5% agreement with the values predicted by the dynamic diffraction theory for perfect crystals when absorption is included. Within 4% experimental error margins, specimen that were exposed to ambient conditions over many years show identical reflectivity as specimen that were cleaved just before the measurement. No differences are observed between cleaving off a 10 μm surface layer and splitting the entire crystal bulk of 2 mm thickness. We conclude that at 1.7 keV photon energy the penetration depth of ∼ 1 μm is large compared to a potentially deteriorated surface layer of a few 10 nm.
影响因子：
8.6
作者：
Ciricosta, O.;Vinko, S. M.;Wark, J. S.
通讯作者：
Wark, J. S.