Truly Stripping Functionality for Logic Locking: A Fault-Based Perspective
Truly Stripping Functionality for Logic Locking: A Fault-Based Perspective
复制标题
真正剥离逻辑锁定的功能:基于故障的视角
DOI:
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复制
发表时间:
2020
影响因子:
2.9
通讯作者:
O. Sinanoglu
中科院分区:
文献类型:
--
作者:
A. Sengupta;M. Nabeel;Nimisha Limaye;M. Ashraf;O. Sinanoglu
Logic locking is a holistic solution to counter manufacturing threats, such as intellectual property (IP) piracy and overbuilding at the hardware level. However, years of research has exposed various flaws in locking, including a Boolean satisfiability (SAT)-based attack. Consequently, several SAT-resilient locking techniques, such as SARLock, Anti-SAT, and SFLL have been proposed, although certain instances of them have also been broken by a class of attacks, called removal attack. In this article, we approach logic locking by leveraging well-known principles from very large-scale integration (VLSI) testing and elicit logic locking properties that dictate the resilience of a locking technique against different attacks. We present a revised version of SFLL, namely SFLL-rem, that not only retains all security properties of SFLL, delivering resilience to all the state-of-the-art attacks SFLL can thwart, but also to the latest removal attacks that broke some SFLL instances. Further, we develop a security-aware CAD framework integrated with industry tools that incurs only −1.5%, 0%, and 4.13% overhead for power, performance, and area, respectively. We demonstrate a silicon implementation of SFLL-rem on ARM Cortex-M0 microprocessor in 65 nm. Moreover, we provide a framework for an SoC designer to customize logic locking based on the SoC blocks and their threat models; this is illustrated by locking a multimillion-gate SoC provided by DARPA, and taking the SoC all the way to GDSII layout.
DOI:
10.1109/iccad.2017.8203759
发表时间:
2017-11
期刊:
2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
影响因子:
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作者:
H. Zhou;Ruifeng Jiang;Shuyu Kong
通讯作者:
H. Zhou;Ruifeng Jiang;Shuyu Kong
DOI:
10.1145/3060403.3060469
发表时间:
2017-05
期刊:
Proceedings of the Great Lakes Symposium on VLSI 2017
影响因子:
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作者:
Yuanqi Shen;H. Zhou
通讯作者:
Yuanqi Shen;H. Zhou