Doped Organic Semiconductors: Trap‐Filling, Impurity Saturation, and Reserve Regimes

Doped Organic Semiconductors: Trap‐Filling, Impurity Saturation, and Reserve Regimes
复制标题

掺杂有机半导体:陷阱填充、杂质饱和和储备机制

DOI:
10.1002/adfm.201404549
复制
发表时间:
2015
影响因子:
19
通讯作者:
Björn Lüssem
Björn Lüssem
中科院分区:
材料科学1区
文献类型:
--
作者:
Max L. Tietze;Paul Pahner;Kathleen Schmidt;Karl Leo;Björn Lüssem

文献摘要

参考文献

被引文献

相似文献

一个典型的人的口袋里装有数十亿个硅基场效应晶体管。使这些晶体管工作的原因是通过掺杂和场效应进行费米能级控制。有机半导体是新型柔性电子时代的核心,但掺杂的关键效应仍然知之甚少。在这里,通过真空共升华证明了对低至 10−5in p 和 n 掺杂有机薄膜的精确处理摩尔掺杂比,从而可以全面研究有机半导体整个电子能隙的费米能级控制。特别是,首次在有机半导体中观察到掺杂剂饱和和储备状态。这些结果将允许全新的有机晶体管设计规则,具有改进的长期稳定性和精确的参数控制。
A typical human being carries billions of silicon‐based field‐effect transistors in his/her pockets. What makes these transistors work is Fermi level control, both by doping and field effect. Organic semiconductors are the core of a novel flexible electronics age, but the key effect of doping is still little understood. Here, precise handling is demonstrated for molar doping ratios as low as 10−5in p‐ and n‐doped organic thin‐films by vacuum co‐sublimation, allowing comprehensive studying of the Fermi level control over the whole electronic gap of an organic semiconductor. In particular, dopant saturation and reserve regimes are observed for the first time in organic semiconductors. These results will allow for completely new design rules of organic transistors with improved long term stability and precise parameter control.
DOI: 10.1016/j.orgel.2012.11.031
发表时间: 2013-02-01
影响因子: 3.2
作者:
Glaser, Tobias;Beck, Sebastian;Pucci, Annemarie
通讯作者: Pucci, Annemarie
DOI: 10.1038/ncomms3775
发表时间: 2013
影响因子: 16.6
作者:
Luessem, Bjoern;Tietze, Max L.;Kleemann, Hans;Hossbach, Christoph;Bartha, Johann W.;Zakhidov, Alexander;Leo, Karl
通讯作者: Leo, Karl
DOI: 10.1016/j.orgel.2013.05.036
发表时间: 2013-09-01
影响因子: 3.2
作者:
Tietze, Max L.;Leo, Karl;Luessem, Bjoern
通讯作者: Luessem, Bjoern
使用高效空气不稳定掺杂剂在空气暴露期间进行分子 n 型掺杂的自钝化
DOI: --
发表时间: 2013
期刊:
影响因子: --
作者:
M. Tietze;Florian Wölzl;T. Menke;A. Fischer;M. Riede;K. Leo;B. Lüssem
通讯作者: B. Lüssem