Determining the effect of burn-in process on reliability of X7R multilayer ceramic capacitors
Determining the effect of burn-in process on reliability of X7R multilayer ceramic capacitors
复制标题
确定老化过程对 X7R 多层陶瓷电容器可靠性的影响
DOI：
10.1007/s10853-022-07623-9
复制
发表时间：
2022
影响因子：
4.5
通讯作者：
Randall, Clive A.
中科院分区：
文献类型：
--
作者：
Yousefian, Pedram;Randall, Clive A.
随着越来越多的电容器被制造并集成到社会的电子基础设施中，贱金属电极（BME）多层陶瓷电容器（mlcc）继续以更高的体积电容、更高的电压和更高的温度工作范围向前发展。其中许多应用包括航空航天、运输、计算、医疗、卫星、军事和物联网，这意味着这些设备的相互依赖性需要在集体和单个组件级别上具有更高的可靠性。因此，确定mlcc的寿命可靠性对于提供更可靠的组件和电气化基础设施的薄弱环节至关重要。对于支持军事和卫星系统的一些较昂贵的系统，可靠性测试是非常广泛的。老化试验是一种筛选程序，用于去除婴儿死亡失败概率较高的成分。在这个过程中，组件暴露在相对于其设计的高温和高压下。热激去极化电流结果表明，烧蚀引起了氧空位在晶内和穿晶的迁移，并且在烧蚀后不会松弛。通过原位高加速寿命试验获得的失效时间数据表明，老化试验不仅在检测婴儿死亡率失效方面无效，而且还会产生弱种群，从而对BME mlcc的可靠性产生负面影响。灼烧过程中氧空位的电迁移降低了晶界和电极界面双肖特基势垒的保护作用，从而缩短了MLCC群体的寿命。
Base metal electrode (BME) multilayer ceramic capacitors (MLCCs) continue to advance with higher volumetric capacitance, higher voltage, and higher-temperature operational ranges with greater numbers of capacitors being manufactured and integrated into the electronic infrastructure of society. Many of these applications range from aerospace, transport, computation, medical, satellite, military, and the internet of things means the interdependence of these devices require higher reliability at a collective and individual component level. Thus, determining the lifetime reliability of MLCCs is critical to provide more reliable components, and no weak links to the electrified infrastructure. For some of the more costly systems that support military and satellite systems, the reliability testing is very extensive. The burn-in test is a screening procedure used to remove components with higher probability of infant mortality failures. In this process, components are exposed to high temperatures and voltages relative to their design. The thermal stimulated depolarization current results revealed that burn-in test caused the intragranular and transgranular migration of oxygen vacancies, which will not be relaxed after the burn-in test. Time to failure data obtained through in situ highly accelerated lifetime tests demonstrated that not only burn-in tests were ineffective at detecting infant mortality failures, but they also had a negative impact on reliability of BME MLCCs by creating a weak population. The electromigration of oxygen vacancies during burn-in tests shorten the lifetime of MLCC population by reducing the protection effects of double Schottky barriers at the grain boundaries and electrode interfaces.
离开浴缸走上过山车曲线（电子设备故障）
DOI：
10.1109/arms.1988.196476
发表时间：
1988
期刊：
1988. Proceedings., Annual Reliability and Maintainability Symposium,
影响因子：
--
作者：
Kam L. Wong;M. Beach;Dean L. Lindstrom
通讯作者：
Dean L. Lindstrom
可靠性、良率和应力老化
影响因子：
3.9
作者：
W. Kuo;W. Chien;Taeho Kim
通讯作者：
Taeho Kim
基于威布尔失效的老化策略
影响因子：
7
作者：
W. Chien;C. Huang
通讯作者：
C. Huang