Electronic structure of interstitial hydrogen in In-Ga-Zn-O semiconductor simulated by muon
Electronic structure of interstitial hydrogen in In-Ga-Zn-O semiconductor simulated by muon
复制标题
μ子模拟In-Ga-Zn-O半导体中间隙氢的电子结构
DOI:
10.1063/1.5117771
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发表时间:
2019
影响因子:
4
通讯作者:
H. Hosono
中科院分区:
文献类型:
--
作者:
K. Kojima;M. Hiraishi;H. Okabe;A. Koda;R. Kadono;K. Ide;S. Matsuishi;H. Kumomi;T. Kamiya;H. Hosono
We report on the local electronic structure of interstitial muon (Mu) as pseudo-hydrogen in In-Ga-Zn oxide (IGZO) semiconductor studied by muon spin rotation/relaxation ($\mu$SR) experiment. In polycrystalline (c-) IGZO, it is inferred that Mu is in a diamagnetic state, where the $\mu$SR time spectra under zero external field is perfectly described by the Gaussian Kubo-Toyabe relaxation function with the linewidth $\Delta$ serving as a sensitive measure for the random local fields from In/Ga nuclear magnetic moments. The magnitude of $\Delta$ combined with the density functional theory calculations for H (to mimic Mu) suggests that Mu occupies Zn-O bond-center site (Mu$_{\rm BC}$) similar to the case in crystalline ZnO. This implies that the diamagnetic state in c-IGZO corresponds to Mu$_{\rm BC}^+$, thus serving as an electron donor. In amorphous (a-) IGZO, the local Mu structure in as-deposited films is nearly identical with that in c-IGZO, suggesting Mu$_{\rm BC}^+$ for the electronic state. In contrast, the diamagnetic signal in heavily hydrogenated a-IGZO films exhibits the Lorentzian Kubo-Toyabe relaxation, implying that Mu accompanies more inhomogeneous distribution of the neighboring nuclear spins that may involve Mu$^-$H$^-$-complex state in an oxygen vacancy.
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影响因子:
4
作者:
Bang, Joonho;Matsuishi, Satoru;Hosono, Hideo
通讯作者:
Hosono, Hideo
影响因子:
3.2
作者:
Nomura, Kenji;Kamiya, Toshio;Hosono, Hideo
通讯作者:
Hosono, Hideo
DOI:
--
发表时间:
2019
期刊:
影响因子:
--
作者:
Toshio Kamiya;Keisuke Ide;Hideya Kumomi;and Hideo Hosono
通讯作者:
and Hideo Hosono
DOI:
--
发表时间:
2004
期刊:
Physical Review B 70
影响因子:
--
作者:
K.M.Kojima;et al.
通讯作者:
et al.