Mask or Enhance: Data Curation Aiding the Discovery of Piezoresponse Force Microscopy Contributors
Mask or Enhance: Data Curation Aiding the Discovery of Piezoresponse Force Microscopy Contributors
复制标题
掩盖或增强:数据管理有助于发现压电响应力显微镜贡献者
DOI:
10.1002/apxr.202200090
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发表时间:
2023
期刊:
影响因子:
--
通讯作者:
Bassiri‐Gharb, Nazanin
中科院分区:
文献类型:
--
作者:
Ligonde, Gardy Kevin;Williams, Kerisha N.;Gaponenko, Iaroslav;Bassiri‐Gharb, Nazanin
Piezoresponse force microscopy (PFM) is routinely used to probe the nanoscale electromechanical response of ferroelectric and piezoelectric materials. However, many challenges remain in the interpretation of the recovered signal. Specifically, many non‐ferroelectric contributions affect the measured response, ranging from electrostatics, to charge injection and trapping, and topographic cross‐talk. Recently, machine learning (ML) has been utilized to identify multiple contributors within complex data systems, such as PFM response. A substantial advancement in ML approaches for PFM techniques is offered by dimensional stacking, enabling encoding of physical and/or chemical correlations within the materials' response across different data dimensions spanning varying ranges. However, dimensional stacking requires appropriate scaling for each dimension (before ML analysis) to minimize undesired information loss. Here, the impact of clustering globally and locally scaled parameters in polarization switching experiments via resonant PFM (RPFM) are discussed. Specifically, dimensional stacking of scaled parameters can mask or enhance ferroelectric and non‐ferroelectric behaviors, and aid identification of various physical phenomena contributing to the measured RPFM response. This study highlights the importance of data curation for ML, and its role in identifying signal contributors to scanning probe microscopy (SPM)‐based techniques with multidimensional data, such as resonant and/or spectroscopic SPM.
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