A Generic Construction for Intrusion-Resilient Signatures from Linear Feedback Shift Register
A Generic Construction for Intrusion-Resilient Signatures from Linear Feedback Shift Register
复制标题
线性反馈移位寄存器的抗入侵签名的通用结构
DOI:
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发表时间:
2008
影响因子:
1.1
通讯作者:
中科院分区:
文献类型:
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With the development of various cryptographic primitives deployed on insecure devices, key exposure seems inevitable. Generalized from forward-secure signatures and key-insulated signatures, intrusion-resilient signatures (IRSs) was first introduced by Itkis and Reyzin, which help us to minimize the damage of key exposure. IRSs provide the unforgeability for the past and future time periods unless both the signer and the home base modules were compromised simultaneously (even in this worst case, IRSs preserve the unforgeability for the past periods). In this paper, we propose a practical generic construction for IRSs. By applying our proposal, one can simply transform any signature scheme to a practical intrusion-resilient signature scheme. In particular, we present a concrete paradigm from linear feedback shift register (LFSR). Our LFSR-based paradigm's base and signer secret keys can be reduced to just a half length of the regular ones, which is useful to save the communication and storage costs. Moreover, if the underlying signature is unforgeable in the standard model, then our construction is also intrusion-resilient in the standard model without any extra assumptions.
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DOI:
10.1007/3-540-44647-8_20
发表时间:
2001-08
期刊:
IACR Cryptol. ePrint Arch.
影响因子:
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作者:
G. Itkis;Leonid Reyzin
通讯作者:
G. Itkis;Leonid Reyzin
DOI:
10.1007/3-540-45708-9_32
发表时间:
2002-08
期刊:
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影响因子:
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作者:
G. Itkis;Leonid Reyzin
通讯作者:
G. Itkis;Leonid Reyzin
DOI:
10.1145/319709.319716
发表时间:
1999-11
期刊:
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影响因子:
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作者:
R. Cramer;V. Shoup
通讯作者:
R. Cramer;V. Shoup
DOI:
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发表时间:
2003-05
期刊:
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
影响因子:
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作者:
C. H. Tan;X. Yi;C. Siew
通讯作者:
C. H. Tan;X. Yi;C. Siew
DOI:
10.1145/948109.948130
发表时间:
2003-10
期刊:
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影响因子:
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作者:
Eric Cronin;S. Jamin;T. Malkin;P. Mcdaniel
通讯作者:
Eric Cronin;S. Jamin;T. Malkin;P. Mcdaniel