Evidence of Edge Conduction at Nanotube/Metal Contact in Carbon Nanotube Devices
Evidence of Edge Conduction at Nanotube/Metal Contact in Carbon Nanotube Devices
复制标题
碳纳米管器件中纳米管/金属接触的边缘传导证据
DOI：
10.1143/jjap.46.l474
复制
发表时间：
2007
影响因子：
1.5
通讯作者：
T. Mizutani
中科院分区：
文献类型：
--
作者：
Yosuke Nosho;Y. Ohno;S. Kishimoto;T. Mizutani
利用多探针器件研究了碳纳米管器件中纳米管与接触电极之间的电流流动路径。用两种方法计算了接触电阻和通道电阻；传输线模型技术与四探头测量。通过对结果的比较，我们发现四探头测量所评估的通道电阻包括接触电阻。这表明广泛使用的四探针测量方法不适用于评估纳米管器件的通道电阻，不包括接触电阻。这一发现还表明，电子在纳米管和接触金属之间的传递发生在接触电极的边缘。
We have investigated the current flow path between the nanotube and the contact electrode in carbon nanotube devices using multiprobe devices. The contact and channel resistances have been evaluated by two methods; transmission-line-model technique and four-probe measurement. By comparing the results, we have found that channel resistance evaluated by the four-probe measurement includes contact resistance. This indicates that the widely used four-probe measurement is not applicable to nanotube devices for the evaluation of channel resistance excluding contact resistance. This finding also implies that electron transport between the nanotube and the contact metal occurs at the edge of the contact electrode.
影响因子：
3.5
作者：
Nosho, Y.;Ohno, Y.;Mizutani, T.
通讯作者：
Mizutani, T.
影响因子：
10.8
作者：
Chen, ZH;Appenzeller, J;Avouris, P
通讯作者：
Avouris, P
影响因子：
8.6
作者：
Bezryadin, A;Verschueren, ARM;Dekker, C
通讯作者：
Dekker, C