Association between exposure to electromagnetic fields from high voltage transmission lines and neurobehavioral function in children.

Association between exposure to electromagnetic fields from high voltage transmission lines and neurobehavioral function in children.
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DOI:
10.1371/journal.pone.0067284
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发表时间:
2013
期刊:
影响因子:
3.7
通讯作者:
Peng X
Peng X
中科院分区:
综合性期刊3区
文献类型:
--
作者:
Huang J;Tang T;Hu G;Zheng J;Wang Y;Wang Q;Su J;Zou Y;Peng X

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暴露于高压输电线(HVT)发射的电磁场(EMF)与儿童神经行为功能障碍之间可能存在因果关系的证据不足。本研究的目的是探讨电磁场暴露从HVT线和儿童的神经行为功能之间的关联。根据环境电磁辐射监测数据,选择了两所小学。对437名儿童(9至13岁)进行了横断面研究。在每所学校监测来自HVT线路的EMF暴露。使用标准化问卷收集可能的混杂因素和相关暴露预测因素的信息。儿童的神经行为功能采用已建立的计算机化神经行为测试进行评估。使用多变量回归模型分析数据,调整相关混杂因素。在控制了潜在的混杂因素后,多变量回归分析显示,在500 kV HVT线路附近上学的儿童在视觉保持和追求目标的计算机化神经行为测试中的表现比在不靠近HVT线路的学校上学的儿童差。结果表明,长期低水平暴露于HVT线电磁场可能会对儿童的神经行为功能产生负面影响。然而,由于四项测试中只有两项的结果差异达到统计学显著性和潜在的局限性,需要更多的研究来探索暴露于极低频电磁场对儿童神经行为功能和发育的影响。
Evidence for a possible causal relationship between exposure to electromagnetic fields (EMF) emitted by high voltage transmission (HVT) lines and neurobehavioral dysfunction in children is insufficient. The present study aims to investigate the association between EMF exposure from HVT lines and neurobehavioral function in children. Two primary schools were chosen based on monitoring data of ambient electromagnetic radiation. A cross-sectional study with 437 children (9 to 13 years old) was conducted. Exposure to EMF from HVT lines was monitored at each school. Information was collected on possible confounders and relevant exposure predictors using standardized questionnaires. Neurobehavioral function in children was evaluated using established computerized neurobehavioral tests. Data was analyzed using multivariable regression models adjusted for relevant confounders. After controlling for potential confounding factors, multivariable regression revealed that children attending a school near 500 kV HVT lines had poorer performance on the computerized neurobehavioral tests for Visual Retention and Pursuit Aiming compared to children attending a school that was not in close proximity to HVT lines. The results suggest long-term low-level exposure to EMF from HVT lines might have a negative impact on neurobehavioral function in children. However, because of differences in results only for two of four tests achieved statistical significance and potential limitations, more studies are needed to explore the effects of exposure to extremely low frequency EMF on neurobehavioral function and development in children.
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