Tunnel conductance via interfacial states in semimetal/semiconductor/semimetal junctions
Tunnel conductance via interfacial states in semimetal/semiconductor/semimetal junctions
复制标题
半金属/半导体/半金属结中界面状态的隧道电导
DOI:
10.1103/physrevb.74.155329
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发表时间:
2006
影响因子:
3.7
通讯作者:
J. Inoue
中科院分区:
文献类型:
--
作者:
S. Honda;T. Kondo;H. Itoh;J. Inoue
The interfacial density of states and conductance of $\mathrm{Gd}\mathrm{As}∕\mathrm{Ga}\mathrm{As}∕\mathrm{Gd}\mathrm{As}$ junctions, where GdAs and GaAs are a semimetal and a semiconductor, respectively, are calculated using a full-orbital tight-binding model. The tunnel conductance of the junction is calculated using the Kubo formula at zero temperature assuming coherent tunneling of electrons. Emphasizing the role of interfacial states on the conductance, the following results are obtained. The interfacial states extend 2-4 atomic layers from the interface; however, the effect of the interfacial states on the conductance extends up to nearly 10 atomic GaAs layers, and nonmonotonic dependence of the tunnel conductance on the barrier thickness appears for thin GaAs layers. The height of the interfacial density of states does not necessarily correlate with the magnitude of the tunnel conductance. The matching between the Fermi surface of the leads and interfacial states governs the magnitude of the tunnel conductance. It is also found that the nonmonotonic dependence of the tunnel conductance is caused by an interference effect of the interface states existing at the two interfaces of GaAs layer.
影响因子:
8.6
作者:
Tanaka, M;Higo, Y
通讯作者:
Higo, Y
DOI:
10.1143/jjap.42.l419
发表时间:
2003-04-15
期刊:
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS
影响因子:
--
作者:
Inomata, K;Okamura, S;Tezuka, N
通讯作者:
Tezuka, N