Phase-resolved imaging of edge-mode spin waves using scanning transmission x-ray microscopy

Phase-resolved imaging of edge-mode spin waves using scanning transmission x-ray microscopy
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使用扫描透射 X 射线显微镜对边缘模式自旋波进行相位分辨成像

DOI:
10.1016/j.jmmm.2016.09.096
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发表时间:
2016
影响因子:
2.7
通讯作者:
Bailey, W.E.
Bailey, W.E.
中科院分区:
材料科学3区
文献类型:
--
作者:
Cheng, C.;Cao, W.;Bailey, W.E.

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我们利用2 GHz和70 nm分辨率的时间分辨扫描透射x射线显微镜(STXM),对纳米级ni81fe19椭圆顶点处~ 100 nm范围内的小振幅自旋波本征模式的激发进行了成像。利用STXM的埋层灵敏度,我们发现在椭圆上沉积导电层和不沉积导电层的样品中,两个顶点的磁化进动从主要的同相到非相变化。作为相位反转的合理解释,我们提出在不连续的覆盖层中产生了意想不到的强奥斯特场,尽管不能完全排除边缘粗糙度的影响。结果表明,STXM能够成像小振幅、GHz的磁化动态,并具有在纳米尺度上绘制射频磁场的潜力。
We have imaged the excitation of small-amplitude spin-wave eigenmodes, localized within ∼100 nm of the vertices of nanoscale Ni81Fe19ellipses, using time-resolved scanning transmission x-ray microscopy (STXM) at 2 GHz and resolution of 70 nm. Taking advantage of the buried-layer sensitivity of STXM, we find that the magnetization precession at the two vertices changes from predominantly in-phase to out-of-phase in samples with and without a conductive layer deposited over the ellipses. As a plausible interpretation for the reversal in phase, we propose that unexpectedly strong Oersted fields are generated in the discontinuous overlayer, although effects of edge roughness cannot be fully excluded. The results demonstrate the capabilities of STXM to image small-amplitude, GHz magnetization dynamics with the potential to map rf magnetic fields on the nanoscale.
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