X-ray diffraction tomography with limited projection information.
X-ray diffraction tomography with limited projection information.
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DOI：
10.1038/s41598-017-19089-w
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发表时间：
2018-01-11
影响因子：
4.6
通讯作者：
Pang S
中科院分区：
文献类型：
--
作者：
Zhu Z;Katsevich A;Kapadia AJ;Greenberg JA;Pang S
X 射线衍射断层扫描 (XDT) 记录扩展物体的空间分辨 X 射线衍射剖面。与传统的透射断层扫描相比，XDT 在电子密度相似的材料中表现出较高的固有对比度，并且由于衍射光子携带的分子结构信息，提高了材料识别的准确性。然而，由于衍射信号较弱，覆盖整个物体的断层扫描通常需要同步加速器设施以使采集时间更易于管理。医疗和工业环境中的成像应用通常不需要检查整个物体。因此，非常需要仅覆盖感兴趣区域（ROI）的衍射断层扫描模态以及随后具有截断投影的图像重建技术。在这里，我们提出了一种台式衍射断层扫描系统，可以解析扩展样本内部区域的空间变化衍射形状因子。我们证明，内部重建保持了材料对比度，同时将成像时间减少了 6 倍。所提出的方法可以加速 XDT 的采集并应用于便携式成像应用，并减少辐射剂量。
X-ray diffraction tomography (XDT) records the spatially-resolved X-ray diffraction profile of an extended object. Compared to conventional transmission-based tomography, XDT displays high intrinsic contrast among materials of similar electron density and improves the accuracy in material identification thanks to the molecular structural information carried by diffracted photons. However, due to the weak diffraction signal, a tomographic scan covering the entire object typically requires a synchrotron facility to make the acquisition time more manageable. Imaging applications in medical and industrial settings usually do not require the examination of the entire object. Therefore, a diffraction tomography modality covering only the region of interest (ROI) and subsequent image reconstruction techniques with truncated projections are highly desirable. Here we propose a table-top diffraction tomography system that can resolve the spatially-variant diffraction form factor from internal regions within extended samples. We demonstrate that the interior reconstruction maintains the material contrast while reducing the imaging time by 6 folds. The presented method could accelerate the acquisition of XDT and be applied in portable imaging applications with a reduced radiation dose.
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影响因子：
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Harding, G
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